Fluorescence Detection Correction via Scattered Light Normalization
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Solution Overview
Problem
Fluorescence detecting methods using surface plasmon suffer from poor reproducibility due to fluctuations in the intensity of electric field enhancing fields caused by various factors such as human error, physical irregularities, and environmental changes, leading to inconsistent measurements.
Innovation Solution
A fluorescence detecting method and apparatus that utilize a correcting mechanism to normalize and correct the intensity of fluorescence based on the intensity of scattered light, which is proportional to the electric field enhancing field, allowing for consistent measurements without the need for optimal component selection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If surface plasmon fluorescence detection is performed without correction, then high sensitivity detection can be achieved, but measurement reproducibility deteriorates due to fluctuations in electric field enhancing field intensity
Solution Approach 1:
The patent implements a feedback mechanism by detecting scattered light intensity (which reflects electric field enhancing field intensity) and using it to correct the fluorescence signal. The correction process adjusts the fluorescence intensity based on the ratio between measured fluorescence and scattered light, creating a closed-loop system that compensates for field fluctuations and improves measurement reproducibility while preserving detection sensitivity
Solution Approach 2:
The patent changes the parameter being measured by introducing scattered light detection as an additional measurement channel. By monitoring scattered light intensity variations and using them to normalize fluorescence signals, the system transforms the problem of field intensity fluctuations into a correctable parameter relationship, thereby maintaining sensitivity while improving reproducibility
2Reliability
If optimal component selection is performed for each measurement to suppress fluctuations, then measurement reproducibility is improved, but device complexity and cost increase
Solution Approach 1:
The system performs self-correction by automatically detecting scattered light and using it to normalize fluorescence measurements in real-time. This self-service mechanism eliminates the need for manual component optimization for each measurement, as the system autonomously compensates for fluctuations through the correction process, thereby improving reproducibility without increasing operational complexity
Solution Approach 2:
The feedback mechanism provides real-time compensation for field fluctuations, replacing the need for pre-measurement component optimization. By continuously monitoring scattered light and adjusting the fluorescence interpretation accordingly, the system achieves consistent reproducibility without requiring complex component selection procedures
3Reliability
If scattered light detection is added for correction, then measurement reproducibility is improved, but device complexity increases due to additional photodetector
Solution Approach 1:
The scattered light detection system serves multiple functions: it provides the correction signal for normalization, characterizes the electric field enhancing field state, and enables quality control of measurements. By making the scattered light detection multi-functional, the patent justifies the additional photodetector as providing multiple benefits rather than a single function, thereby reducing the perceived complexity increase
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables reproducible measurements by stabilizing the intensity of fluorescence relative to the electric field enhancing field, reducing the impact of measurement-specific factors and allowing for reliable detection of target substances at low cost.
Implementation Method 1
surface plasmon within the metal film 12 are excited by the evanescent waves. The evanescent waves and the surface plasmon cause an electric field enhancing field Ew that exhibits an electric field enhancing effect to be formed locally on the surface of the metal film 12
Implementation Method 2
the fluorescent labels F are present within the electric field enhancing field Ew, and the fluorescent labels F are excited and caused to emit fluorescence Lf
Implementation Method 3
a photodetector 30 that detects fluorescence Lf generated by fluorescent labels F
Implementation Method 4
scattered light of the electric field enhancing field, which is substantially proportionate to the intensity of the electric field enhancing field, being detected with a second photodetector
Data Source
AI summary
Fluorescence detection utilizes surface plasmon. The intensity of scattered light, which is substantially proportionate to the intensity of an electric field enhancing field generated on a metal film, is employed, to normalize and correct the intensity of fluorescence emitted by fluorescent labels with respect to the intensity of the electric field enhancing field.