Fluorescent X-Ray Analysis with Tube-Current Dead-Time Control
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Solution Overview
Problem
Existing fluorescent X-ray analysis apparatuses require a dedicated variable attenuator to adjust the dead time of the counting circuit, which is different from a filter and collimator, complicating the setup and potentially requiring frequent recalibration with apparatus upgrades or sample changes.
Innovation Solution
A fluorescent X-ray analysis method and apparatus that uses a paralyzed model to calculate the reference tube current based on a desired dead time rate, determining the measurement tube current, and irradiating the sample with X-rays to achieve accurate dead time adjustment without a dedicated attenuator.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a dedicated variable attenuator is used to adjust dead time, then dead time control precision is improved, but device complexity increases
Solution Approach 1:
The patent applies multi-functionality by enabling the existing X-ray tube and counting circuit to serve dual purposes: the X-ray tube not only generates X-rays for analysis but also functions as a variable attenuator through its tube current adjustment capability, while the counting circuit simultaneously performs both counting and dead time control functions, eliminating the need for separate dedicated components
Solution Approach 2:
The patent extracts the dead time control function from a separate dedicated variable attenuator and integrates it into the existing tube current control system. By calculating and adjusting tube current based on dead time rate requirements, the system removes the need for independent attenuator hardware while maintaining precise dead time control
2Measurement precision
If a dedicated variable attenuator is used, then dead time adjustment accuracy is improved, but ease of operation deteriorates
Solution Approach 1:
The system performs self-service by automatically calculating the required tube current adjustment based on the desired dead time rate and current operating conditions. The controller autonomously determines tube current changes without requiring manual intervention or recalibration, making the system self-regulating and easier to operate while maintaining high accuracy
3Adaptability or versatility
If tube current is adjusted frequently for apparatus upgrades or sample changes, then adaptability is improved, but loss of time increases
Solution Approach 1:
The patent applies preliminary action by pre-calculating and storing reference tube current values corresponding to different dead time rates in a lookup table or database. When a new sample or apparatus configuration is introduced, the system can quickly retrieve the appropriate reference values and adjust tube current immediately without performing time-consuming recalibration experiments, thus reducing transition time while maintaining adaptability
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise dead time control of the counting circuit with high accuracy, allowing rapid and automatic adjustment of tube current, independent of apparatus upgrades or sample changes, thus enhancing measurement efficiency.
Implementation Method 1
an X-ray tube configured to irradiate X-rays toward the sample stage
Implementation Method 2
the fluorescent X-rays emitted from the sample are measured to analyze constituent elements of the sample
Implementation Method 3
a detector that detects fluorescent X-rays emitted from the sample on the sample stage
Data Source
AI summary
The fluorescent X-ray analysis method includes: placing a sample in a fluorescent X-ray analysis apparatus (S1); calculating a reference tube current of an X-ray tube by applying a desired dead time rate to a paralyzed model (S3); determining a measurement tube current of the X-ray tube based on the reference tube current and irradiating the sample with X-rays generated by applying the measurement tube current to the X-ray tube (S4); and analyzing fluorescent X-rays obtained by irradiating the sample with the X-rays (S5). Thus, a desired dead time of the counting circuit can be obtained with high accuracy.


