Plasma Fluorine Insertion in Transition Metal Oxides

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Solution Overview

Problem

Transition metal oxide semiconductors, particularly titanium oxide, face instability and reduced conductivity due to oxygen vacancies, which compromise their use in semiconductor devices and catalytic applications, as they become metallic conductors and suffer from charge trapping and chemical reactivity issues.

Innovation Solution

The introduction of fluorine into the transition metal oxide films through plasma fluorine insertion, which binds to oxygen vacancies, increases conductivity while stabilizing the material by filling these defects, thereby enhancing the semiconductor properties without introducing unstable oxygen vacancies.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If oxygen vacancies are introduced to increase conductivity, then electrical conductivity is improved, but material stability deteriorates

Engineering Contradiction:
Improvematerial stabilityVSAvoidelectrical conductivity
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

Fluorine atoms are introduced as intermediary species that bind to oxygen vacancies, mediating between the conflicting requirements of high conductivity (requiring vacancies) and high stability (requiring defect-free lattice). The fluorine passivates the harmful effects of vacancies while preserving the conductive pathways, acting as a bridge between these opposing demands.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The oxygen vacancies, which are inherently harmful to material stability, are converted into beneficial features by introducing fluorine. The fluorine binds to the vacancies, transforming them from defect sites that cause instability into passivated sites that maintain conductivity while eliminating harmful effects. This converts the 'harm' of vacancies into a 'blessing' of stable, conductive material.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Use of energy by moving object

If extrinsic chemical doping is used to modify electronic structure, then visible light absorption is improved, but semiconductor properties deteriorate

Engineering Contradiction:
Improvevisible light absorptionVSAvoidsemiconductor properties
Core Design Contradiction:
Use of energy by moving objectVSReliability

Solution Approach 1:

Instead of changing the chemical composition through impurity doping, the invention changes the physical state and electronic structure by introducing fluorine interstitials. This parameter change (adding fluorine in specific concentrations and positions) modifies the band structure to enable visible light absorption while preserving the semiconductor character, avoiding the formation of metallic mid-gap states.

Inventive Principle:
Principle #35Parameter changes

3Loss of energy

If intrinsic doping through oxygen vacancy manipulation is performed, then surface conductivity is improved, but charge trapping increases

Engineering Contradiction:
Improvesurface conductivityVSAvoidcharge trapping
Core Design Contradiction:
Loss of energyVSReliability

Solution Approach 1:

Fluorine atoms serve as intermediary species that occupy positions between oxygen vacancies and charge carriers. They mediate the interaction by providing passivation that prevents charge trapping at vacancy sites while maintaining the conductive pathways necessary for surface conductivity. This intermediary action resolves the conflict between conductivity and charge trapping.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach results in highly conductive, stable transition metal oxide films with improved rectification and electron transport capabilities, suitable for various device applications such as transparent thin film transistors, resistive oxide memory, and catalytic reactions, by passivating defects and raising the Fermi level, thus increasing the utility of these materials in charge transport and catalytic applications.

Implementation Method 1

The introduction of fluorine into the transition metal oxide films through plasma fluorine insertion, which binds to oxygen vacancies

Methodology Applied
Scientific EffectAdsorption: Adsorption

Implementation Method 2

The introduction of fluorine into the transition metal oxide films through plasma fluorine insertion

Methodology Applied
Scientific EffectPlasma: Plasma

Data Source

PatentUS9312342B2Generation of highly N-type, defect passivated transition metal oxides using plasma fluorine insertion
Publication Date: 2016.04.12 RGT UNIV OF CALIFORNIA
  • US9312342B2 patent drawing
  • US9312342B2 patent drawing
  • US9312342B2 patent drawing

AI summary

A new composition of matter is disclosed wherein oxygen vacancies in a semiconducting transition metal oxide such as titanium dioxide are filled with a halogen such as Fluorine, whereby the conductivity of the composition is greatly enhanced, while at the same time the chemical stability of the composition is greatly improved. Stoichiometric titanium dioxide having less than 3 % oxygen vacancies is subject to fluorine insertion such that oxygen vacancies are filled, limited amounts of fluorine replace additional oxygen atoms and fluorine interstitially inserts into the body of the TiO2 composition.