Flying-Over Beam Scanning for High-Speed Hologram Microscopy
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Solution Overview
Problem
Conventional optical scanning hologram microscopes are limited by slow hologram acquisition speeds, particularly when imaging fluids like living bodies, due to mechanical movement of the object plate.
Innovation Solution
A flying-over beam pattern scanning hologram microscope device using a scan mirror and translation stage, employing interference structures between various spherical waves and plane waves to project high-resolution Fresnel zone patterns onto an object plane, enabling high-speed imaging.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If the object plate is mechanically moved to scan the object, then the hologram can be acquired with conventional optical scanning hologram microscope, but the hologram acquisition speed is slow and it is difficult to acquire hologram of fluid such as living body
Solution Approach 1:
The patent replaces the mechanical movement system with an optical scanning system. Specifically, a scan mirror is used to deflect the laser beam, and a spatial light modulator is used to generate and modulate the beam pattern, eliminating the need for mechanical movement of the object plate while achieving high-speed hologram acquisition
Solution Approach 2:
The patent introduces dynamic control of the beam pattern through a spatial light modulator that can rapidly change the phase and amplitude distribution of the laser beam. This allows the beam pattern to be dynamically scanned across the object plane without mechanical movement, enabling high-speed imaging of fluid samples
2Measurement precision
If a beam pattern is formed using interferometer with spatial distribution of Fresnel zone plate, then high-resolution scanning hologram can be achieved, but the object plate must be mechanically moved which limits the acquisition speed
Solution Approach 1:
The patent maintains the interferometric beam pattern formation for high resolution but replaces the mechanical scanning with optical scanning using a scan mirror and spatial light modulator, achieving both high resolution and high acquisition rate
Solution Approach 2:
The patent changes the control parameter from mechanical position to optical phase modulation. The spatial light modulator modulates the phase of the laser beam to create the Fresnel zone plate pattern, and the scan mirror changes the beam position by altering the angle of incidence, enabling rapid parameter changes without mechanical movement
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device achieves high-resolution scanning holograms at increased speeds by forming a flying-over beam pattern on the object plane, allowing for efficient imaging of fluid samples.
Implementation Method 1
the first and second spherical waves to interfere with each other to form a scan beam
Implementation Method 2
an interference structure (first pattern) between a converging spherical wave and a plane wave on the object plane
Implementation Method 3
forming a beam pattern with a spatial distribution of a Fresnel zone plate
Data Source
Figure 1
Figure 2~3A
Figure 3B~4
AI summary
The present invention relates to a flying-over beam pattern scanning hologram microscope device using a scan mirror and a translation stage. The present invention provides a flying-over beam pattern scanning hologram microscope device comprising: a scan beam generation unit which converts a first beam and a second beam to a first spherical wave and a second spherical wave, and then allows the first and second spherical waves to interfere with each other to form a scan beam; a scanning unit, which comprises a scan mirror for controlling the scan beam in the horizontal direction, and a translation stage for moving an object in the vertical direction at the rear end of the projection unit; the projection unit projecting the scan beam onto an object plane; and a light collection unit for detecting a beam that has passed through the objective lens again after fluorescing or being reflected from an object.