FMCW LiDAR Test Instrument for Beat Frequency Analysis

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Solution Overview

Problem

There is a lack of reliable test and measurement instruments suitable for FMCW LiDAR systems, which are necessary for testing and characterizing these devices during development.

Innovation Solution

A test and measurement instrument comprising an arbitrary waveform generator circuit, synchronizing circuit, and signal capturing circuit to process and analyze FMCW based signals, capable of determining beat frequency, linewidth, phase noise, and chirp linearity, among other parameters, using components like a Mach-Zehnder interferometer and acousto-optical modulator.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If traditional test instruments are used for FMCW LiDAR systems, then existing radar testing capabilities are maintained, but the specific testing requirements of FMCW LiDAR systems cannot be met

Engineering Contradiction:
Improvetesting capability for FMCW LiDAR systemsVSAvoidtesting reliability
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The test instrument is configured to generate and analyze FMCW signals with specific parameters (frequency modulation, continuous wave format) that match the operational characteristics of FMCW LiDAR systems. The arbitrary waveform generator circuit is programmed to produce frequency-modulated signals that replicate the chirp signals used by FMCW LiDAR, enabling accurate testing of distance measurement, velocity detection, and signal processing algorithms specific to this technology

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent introduces specialized intermediary components including a Mach-Zehnder interferometer for signal modulation and an acousto-optical modulator for frequency control. These intermediary devices bridge the gap between standard test equipment and FMCW LiDAR requirements by converting generic test signals into the specific FMCW format needed for reliable LiDAR system characterization

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If comprehensive FMCW LiDAR system testing is performed, then complete system characterization is achieved, but device complexity increases

Engineering Contradiction:
Improvesystem characterization accuracyVSAvoidtest instrument complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The test instrument is designed as a multi-functional platform that can perform various FMCW LiDAR testing operations including distance measurement verification, velocity detection testing, signal-to-noise ratio analysis, and point cloud generation. The arbitrary waveform generator, signal capturing circuit, and processing unit work together to provide a unified instrument that replaces multiple specialized devices, reducing overall system complexity while maintaining comprehensive testing capabilities

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent combines multiple testing functions into a single integrated instrument. The signal generation, modulation, capturing, and analysis functions are merged into one device with coordinated circuits and processing units. This consolidation allows comprehensive FMCW LiDAR characterization without requiring separate instruments for each measurement type, thereby managing complexity through integration

Inventive Principle:
Principle #5Merging (Combining)

3Loss of time

If FMCW LiDAR systems are tested during development phase, then early performance assessment is enabled, but specialized test equipment must be developed

Engineering Contradiction:
Improvedevelopment timeVSAvoidtest instrument development
Core Design Contradiction:
Loss of timeVSDevice complexity

Solution Approach 1:

The test instrument is configured with pre-programmed FMCW signal generation capabilities and analysis algorithms that are prepared in advance. The arbitrary waveform generator is pre-configured with frequency modulation parameters, and the processing unit contains ready-to-execute algorithms for distance and velocity calculation. This preliminary preparation enables immediate testing of FMCW LiDAR prototypes without requiring time-consuming equipment setup or calibration during the development process

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The test instrument incorporates self-calibration and automatic parameter adjustment features. The system can autonomously configure test parameters based on the FMCW LiDAR device under test, perform self-verification of measurement accuracy, and automatically adjust signal generation parameters to optimize testing conditions. This self-service capability reduces the need for manual intervention and specialized equipment development while enabling rapid development-phase testing

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables comprehensive characterization of FMCW LiDAR systems and their components, facilitating early evaluation and assessment of performance without requiring the final digital signal processing hardware, with features for image and point cloud creation.

Implementation Method 1

The test and/or measurement instrument is configured to determine at least one frequency-modulated continuous wave (FMCW) based signal component

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

using components like a Mach-Zehnder interferometer and acousto-optical modulator

Methodology Applied
Scientific EffectAcousto-optic effect: Acousto-optic Effect

Data Source

PatentUS20250334683A1Test and/or measurement instrument and test system for testing an optoelectronic device under test
Publication Date: 2025.10.30 ROHDE & SCHWARZ GMBH & CO KG
  • US20250334683A1 patent drawing
  • US20250334683A1 patent drawing
  • US20250334683A1 patent drawing

AI summary

The present disclosure relates to a test and/or measurement instrument for testing an optoelectronic device under test, comprising an arbitrary waveform generator circuit configured to provide at least one stimulus signal for the optoelectronic device under test, a synchronizing circuit configured to provide at least one synchronization signal for the optoelectronic device under test, a signal capturing circuit configured to capture at least one analog signal from the optoelectronic device under test. The test and/or measurement instrument is configured to determine at least one frequency-modulated continuous wave, FMCW, based signal component. Further, a test system is described.