Focus Ring Inspection via Electrostatic Capacitance Scanning

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Solution Overview

Problem

In plasma processing apparatuses, the focus ring is consumed during the processing of objects, leading to uneven processing and the need for frequent replacement, necessitating a method to accurately assess its consumption levels.

Innovation Solution

A system and method utilizing a measuring device with sensor chips and a circuit board to measure electrostatic capacitance, which calculates consumption amounts by scanning the focus ring and obtaining difference values across its periphery, allowing for precise determination of wear levels.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the focus ring is used for plasma processing, then processing capability is maintained, but the focus ring is consumed and requires replacement

Engineering Contradiction:
Improveprocessing capabilityVSAvoidfocus ring consumption
Core Design Contradiction:
ProductivityVSLoss of substance

Solution Approach 1:

The system performs preliminary inspection of the focus ring by measuring electrostatic capacitance at multiple positions before the focus ring is excessively consumed. This allows determining the replacement timing in advance, preventing processing quality degradation while optimizing the usage lifecycle of the focus ring.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If the focus ring is inspected frequently to determine replacement timing, then processing uniformity is maintained, but inspection time and complexity increase

Engineering Contradiction:
Improveprocessing uniformityVSAvoidinspection time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system replaces complex mechanical measurement methods with electrostatic capacitance measurement. By measuring the electrostatic capacitance between the focus ring and a sensor electrode, the system可以快速 determine the thickness or consumption of the focus ring without physical contact or complex mechanical scanning, significantly reducing inspection time while maintaining accuracy.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If electrostatic capacitance measurement is used to inspect the focus ring, then consumption amount is accurately determined, but measurement system complexity increases

Engineering Contradiction:
Improveconsumption amount determination accuracyVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system introduces an intermediary electrode positioned between the focus ring and the measurement system. This intermediary electrode facilitates the electrostatic capacitance measurement by creating a controlled measurement field, allowing accurate determination of focus ring consumption without requiring direct contact or complex positioning mechanisms.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate assessment of focus ring consumption, facilitating timely replacement and maintaining processing uniformity, thereby improving the efficiency and effectiveness of plasma processing operations.

Implementation Method 1

The circuit board is configured to output a high frequency signal to the sensor electrode and acquire a digital value indicating electrostatic capacitance based on a voltage amplitude in the sensor electrode

Methodology Applied
Scientific EffectElectrostatic capacitance: Capacitance

Data Source

PatentUS9841395B2System of inspecting focus ring and method of inspecting focus ring
Publication Date: 2017.12.12 TOKYO ELECTRON LTD
  • US9841395B2 patent drawing
  • US9841395B2 patent drawing
  • US9841395B2 patent drawing

AI summary

A system of inspecting a focus ring is provided. The system includes a measuring device, a transfer device and an operation unit. The measuring device includes a base substrate, a sensor chip and a circuit board. The sensor chip has a sensor electrode and is provided along an edge of the base substrate. The circuit board is configured to output a high frequency signal to the sensor electrode and acquire a digital value indicating electrostatic capacitance based on a voltage amplitude in the sensor electrode. The transfer device is configured to scan the measuring device. The operation unit is configured to obtain difference values by performing a difference operation with respect to the digital values acquired by the measuring device at multiple positions along a direction which intersects with an inner periphery of the focus ring.