Focus Scan Imaging Device Aberration Correction via Scanning Mirror
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Solution Overview
Problem
Current imaging technologies face challenges in achieving real-time high-speed imaging of target objects in mediums that induce aberration and scattering, particularly due to the slow measurement speed of conventional time-gated holographic imaging methods, which hinder real-time observation of living subjects.
Innovation Solution
A focus scan type imaging device is developed, incorporating a light source, optical interferometer, camera module, scanning mirror, wavefront shaping modulator, and imaging controller that uses the CLASS algorithm to calculate and display an aberration-corrected phase map, allowing for real-time correction of sample-induced aberrations by adjusting scanning mirror angles rather than relying on slow spatial light modulator changes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If conventional time-gated holographic imaging methods are used, then imaging of target objects in aberrating media is achieved, but imaging speed is slow and real-time observation is hindered
Solution Approach 1:
The patent replaces the slow spatial light modulator-based wavefront shaping with a scanning mirror system that uses mechanical scanning motion to achieve aberration correction. The scanning mirror rotates at high speed to dynamically adjust the illumination path, eliminating the need for slow iterative wavefront modulation while maintaining real-time imaging capability.
Solution Approach 2:
The patent introduces dynamic scanning mirror rotation to create time-varying illumination patterns that enable aberration correction. By continuously rotating the scanning mirror at high speed, the system achieves real-time adaptive optics without the computational and temporal delays inherent in conventional holographic methods.
2Manufacturing precision
If wavefront shaping modulator is used to correct aberrations, then sample-induced aberrations are corrected, but the process requires iterative adjustment that takes time
Solution Approach 1:
The patent replaces iterative computational wavefront shaping with direct mechanical scanning mirror rotation. Instead of iteratively adjusting a spatial light modulator based on feedback images, the scanning mirror directly implements aberration correction through mechanical motion, eliminating the time-consuming feedback loop while maintaining correction precision.
Solution Approach 2:
The patent performs aberration correction calculations and scanning mirror control in advance based on pre-characterized aberration maps. By preparing the correction parameters beforehand and implementing them through rapid scanning mirror rotation, the system avoids real-time iterative adjustment and achieves instantaneous aberration compensation.
3Loss of time
If model-based modal aberration correction is used, then optimization time is reduced, but it only works for lowest modes of Zernike polynomials
Solution Approach 1:
The patent changes the approach from fixed Zernike polynomial basis functions to a scanning mirror rotation parameterization that naturally accommodates all aberration modes. By controlling the scanning mirror's angular position and rotation speed, the system can correct any aberration pattern without being limited to specific polynomial modes, achieving both speed and versatility.
Solution Approach 2:
The scanning mirror system serves multiple functions simultaneously: it performs aberration correction, enables dynamic imaging, and adapts to various sample conditions. This single mechanical component replaces multiple specialized systems, providing universal aberration correction across all Zernike modes while maintaining real-time imaging capability.
4Manufacturing precision
If plane wave illumination is used to reduce illumination aberrations, then aberrations in illumination light path are minimized, but multiple scattering noises increase due to loss of confocal gating
Solution Approach 1:
The patent uses dynamic scanning mirror rotation to create time-varying illumination patterns that maintain confocal gating while reducing aberrations. The scanning motion dynamically adjusts which regions of the sample are illuminated at any given time, preserving the depth-sectioning capability needed to reject multiple scattering noises while compensating for illumination path aberrations.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces imaging time by physically correcting aberrations in real-time without separate image processing, enabling faster and more accurate imaging of target objects within aberrating media.
Implementation Method 1
an optical interferometer configured to split the beam emitted from the light source into a sample wave and a reference wave, and provide an interference wave formed by interference between a reflection wave that is the sample wave reflected from the sample and the reference wave
Implementation Method 2
a scanning mirror disposed on an optical path of the sample wave of the optical interferometer and configured to reflect the sample wave so as to cause the sample wave to scan the sample
Implementation Method 3
a wavefront shaping modulator disposed on the optical path of the sample wave of the optical interferometer... an imaging controller configured to... display the aberration-corrected phase map on the wavefront shaping modulator
Data Source
AI summary
A focus scan type imaging device for imaging a target object in a sample that induces aberration proposed. The device includes: a light source unit for emitting a beam; an optical interferometer for splitting the beam emitted from the light source into a sample wave and a reference wave, and providing an interference wave formed by interference between a reflection wave that is the sample wave reflected from the sample and the reference wave; a camera module for imaging the interference wave; a scanning mirror disposed on an optical path of the sample wave of the optical interferometer and configured to reflect the sample wave to cause the sample wave to scan the sample; a wavefront shaping modulator disposed on the optical path of the sample wave of the optical interferometer; and an imaging controller configured to operate in a phase map calculation mode and in an imaging mode.