Focused Ion Beam Control for Multi-Condition Region Machining

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Solution Overview

Problem

Existing focused ion beam apparatuses can only set one machining condition for each machining region, requiring users to repeatedly set machining regions when changing conditions, which is inefficient and time-consuming.

Innovation Solution

A focused ion beam apparatus that allows users to set multiple machining conditions for a single machining region, enabling the optical system to scan the region based on these conditions, eliminating the need for repeated region setting.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If only one machining condition is set for one machining region, then the system is simple to operate, but the user has to set the machining region many times to continue machining while changing machining conditions

Engineering Contradiction:
Improveease of setting machining conditionsVSAvoidtime for re-setting machining region
Core Design Contradiction:
Ease of operationVSLoss of time

Solution Approach 1:

The machining region setting is made universal by allowing multiple different machining conditions to be associated with the same machining region. The control unit stores and manages multiple sets of machining conditions (first machining condition, second machining condition, etc.) for a single machining region, enabling the system to switch between different conditions without requiring the user to re-set the region boundaries each time.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Manufacturing precision

If the user sets the machining region many times to change machining conditions, then each condition can be applied correctly, but the operation becomes inefficient and time-consuming

Engineering Contradiction:
Improveprecision of machining condition applicationVSAvoidmachining efficiency
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The system performs preliminary action by pre-storing multiple sets of machining conditions in the control unit before actual machining begins. The control unit holds a first machining condition and a second machining condition ready for use, allowing the machining process to switch between conditions without interruption or re-setting of the region, thereby maintaining precision while improving efficiency.

Inventive Principle:
Principle #10Preliminary action

3Productivity

If multiple machining conditions are stored for one region, then machining can continue with varied conditions without re-setting, but the control system becomes more complex

Engineering Contradiction:
Improvecontinuous machining capabilityVSAvoidcomplexity of control system
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The control unit performs self-service by automatically managing the storage and selection of multiple machining conditions. The system itself handles the complexity of managing multiple conditions (first machining condition, second machining condition, etc.) without requiring additional user intervention or complex external control mechanisms, thereby enabling continuous machining with varied conditions while keeping the user interface simple.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient and easy setting of multiple machining conditions for a single region, reducing the time and effort required for machining by allowing continuous scanning with varied conditions without re-setting the region.

Implementation Method 1

a focused ion beam apparatus that machines a cross section of a specimen by scanning the specimen with an ion beam

Methodology Applied
Scientific EffectIon beam: Ion Beam

Implementation Method 2

machining a cross section of a specimen by scanning the specimen with an ion beam

Methodology Applied
Scientific EffectIon bombardment:

Data Source

PatentUS20240071718A1Focused Ion Beam Apparatus
Publication Date: 2024.02.29 JEOL LTD
  • US20240071718A1 patent drawing
  • US20240071718A1 patent drawing
  • US20240071718A1 patent drawing

AI summary

Provided is a focused ion beam apparatus that machines a cross section of a specimen by scanning the specimen with an ion beam. The focused ion beam apparatus includes an optical system that scans the specimen with the ion beam, a receiving unit that receives setting of a machining region of the specimen and setting of a plurality of machining conditions for the machining region, and a control unit that controls the optical system. The control unit causes the optical system to scan the machining region with the ion beam, based on the machining conditions that have been set for the machining region.