Folded Digit Line Configurations for Memory Integration

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Highly integrated memory arrays face issues with excessive noise due to undesired capacitive coupling between closely-spaced digit lines, which becomes more problematic with increasing levels of integration, and existing solutions often require shielding to mitigate this issue.

Innovation Solution

The implementation of vertically-stacked integrated assemblies with folded-digit-line-configurations that eliminate capacitive coupling without the need for shielding, allowing for tighter packing of digit lines and simplifying fabrication by removing the requirement for shielding.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If digit lines are closely spaced to increase integration density, then productivity is improved, but capacitive coupling between digit lines increases causing excessive noise

Engineering Contradiction:
Improveintegration densityVSAvoidcapacitive coupling noise
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The patent transitions from planar digit line arrangements to three-dimensional folded configurations where digit lines are routed through multiple vertical levels. This dimensional change allows digit lines to be closely spaced in the plane while maintaining physical separation through vertical displacement, thereby increasing integration density without excessive capacitive coupling noise

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The digit lines are segmented into multiple sections that are folded and routed through different vertical levels. This segmentation breaks the continuous planar path into discrete segments that can be spatially separated, reducing capacitive coupling while maintaining signal integrity for high-density integration

Inventive Principle:
Principle #1Segmentation

2Object-affected harmful factors

If shielding is added to reduce capacitive coupling noise, then noise reduction is improved, but device complexity and fabrication difficulty increase

Engineering Contradiction:
Improvecapacitive coupling noiseVSAvoidshielding structure complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The patent extracts and eliminates the need for shielding structures by fundamentally redesigning the digit line geometry. Instead of adding shielding to suppress capacitive coupling, the folded digit line configuration inherently minimizes coupling through its three-dimensional routing, simplifying device complexity while maintaining noise reduction

Inventive Principle:
Principle #2Taking out (Extraction)

3Object-affected harmful factors

If shielding is added to mitigate capacitive coupling, then noise reduction is improved, but ease of manufacture deteriorates

Engineering Contradiction:
Improvecapacitive coupling noiseVSAvoidfabrication simplicity
Core Design Contradiction:
Object-affected harmful factorsVSEase of manufacture

Solution Approach 1:

The patent removes the shielding component entirely from the manufacturing process. The folded digit line configuration achieves noise mitigation through its geometric design alone, eliminating the need for additional shielding fabrication steps and simplifying the overall manufacturing process

Inventive Principle:
Principle #2Taking out (Extraction)

Data Source

PatentUS11069385B1Integrated assemblies comprising folded-digit-line-configurations
Publication Date: 2021.07.20 MICRON TECHNOLOGY INC
  • US11069385B1 patent drawing
  • US11069385B1 patent drawing
  • US11069385B1 patent drawing

AI summary

Some embodiments include an integrated assembly having a second deck over a first deck. A first true digit line has first and second segments along the first deck. A first complementary digit line has third and fourth segments along the second deck. The first true digit line is comparatively compared to the first complementary digit line. A second true digit line has a third region along the first deck and a fourth region along the second deck. The third region is adjacent the first segment, and the fourth region is adjacent the third segment. A second complementary digit line has a fifth region along the first deck and has a sixth region along the second deck. The fifth region is adjacent the second segment, and the sixth region is adjacent the fourth segment. The second true digit line is comparatively compared to the second complementary digit line.