FOUP Airflow Redirection for Contamination-Safe Wafer Transfer
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing substrate transport and handling systems in semiconductor fabrication fail to adequately prevent contamination from environmental factors like moisture and oxygen, leading to potential corrosion and oxidation during the transfer of substrates between processing tools and storage carriers.
Innovation Solution
An air flow optimization device is introduced, which modifies the direction and flow rate of down flow gas to prevent it from entering the substrate carrier when the door is open, using a control device with extension plates to redirect the gas flow obliquely away from the carrier, thereby maintaining a controlled environment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If down flow gas is provided to prevent contamination, then substrate protection is improved, but gas may enter the substrate carrier when door is open causing contamination
Solution Approach 1:
An air flow optimizer device is introduced as an intermediary component between the down flow gas source and the substrate carrier. This device redirects the gas flow direction to be oblique relative to the carrier opening, allowing the gas to protect the substrate from contamination while preventing the gas itself from entering the carrier when the door is open.
Solution Approach 2:
The solution changes the dimensionality of the gas flow by redirecting it from a vertical down flow to an oblique flow direction. The air flow optimizer redirects gas at an angle that allows it to cover the substrate area for protection without directly entering the carrier opening, effectively using directional modification to resolve the contradiction.
2Ease of operation
If FOUP door is opened for substrate access, then substrate transport is enabled, but environmental contamination can enter the carrier
Solution Approach 1:
The air flow optimizer is positioned and configured to redirect gas flow before the substrate carrier door is opened. This preliminary redirection ensures that when the door is opened for substrate access, the protective gas flow is already in place and directed obliquely, preventing environmental contamination from entering while maintaining substrate accessibility.
3Object-affected harmful factors
If vertical down flow gas is used, then contamination prevention is improved, but gas enters the carrier opening when door is open
Solution Approach 1:
The air flow optimizer redirects the vertical down flow gas into an oblique flow direction. This dimensional change in flow direction allows the gas to maintain its protective function against contamination while avoiding direct entry into the carrier opening when the door is open, thus improving ease of operation.
4Productivity
If aggressive scaling down is implemented, then production efficiency is improved, but substrate contamination risk increases
Solution Approach 1:
The air flow optimizer serves as an intermediary device that enhances the existing clean room environment and FOUP protection system. By redirecting gas flow obliquely, it provides an additional layer of protection against contamination, enabling aggressive scaling down to proceed with maintained substrate integrity and reduced contamination risk.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution effectively minimizes the risk of contamination by ensuring that down flow gas does not enter the substrate carrier, reducing the risk of corrosion and oxidation, and maintaining the integrity of the substrates during transport and storage.
Implementation Method 1
modifies the direction and flow rate of down flow gas to prevent it from entering the substrate carrier when the door is open, using a control device with extension plates to redirect the gas flow obliquely away from the carrier
Data Source
AI summary
A system comprises a front opening universal pod (FOUP) configured to hold one or more semiconductor wafers and a load dock having a stage and a receiving portion extending above the stage. The FOUP is positioned on the stage. A fan filter unit (FFU) positioned above the load dock. An air flow optimizer device is disposed on the receiving portion and under the FFU. The air flow optimizer device has an inlet opening and an outlet opening and a channel extends between the inlet opening and the outlet opening.


