FOUP Cover Removal Exhaust System for Oxygen Control

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Solution Overview

Problem

Conventional cover opening/closing apparatuses fail to sufficiently exhaust oxygen, leading to inadequate nitrogen replacement during the removal of FOUP covers, resulting in increased oxygen concentrations in wafer conveyance areas and suboptimal processing conditions for semiconductor wafers.

Innovation Solution

The apparatus includes a cover removal system with a latch key, driving unit, and an exhaust system that exhausts the internal space within the accommodation unit, ensuring nitrogen replacement by closely contacting the opening edge of the substrate outlet with the wafer conveyance port and utilizing an exhaust line connected to a vacuum pump to reduce oxygen concentrations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If nitrogen gas is purged between the opening/closing door and the FOUP, then oxygen concentration is reduced, but the exhaust system is insufficient leading to inadequate nitrogen replacement

Engineering Contradiction:
Improvenitrogen replacement efficiencyVSAvoidoxygen concentration
Core Design Contradiction:
Quantity of substanceVSObject-affected harmful factors

Solution Approach 1:

The exhaust system is divided into multiple exhaust ports distributed at different locations within the wafer conveyance port. This segmentation allows oxygen to be exhausted from multiple points simultaneously, improving nitrogen replacement efficiency and reducing oxygen concentration more effectively than a single exhaust point.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The exhaust ports are arranged in both horizontal and vertical directions, creating a three-dimensional exhaust network. This multi-dimensional arrangement ensures comprehensive coverage of the wafer conveyance port interior, preventing oxygen accumulation in any region and enhancing the overall nitrogen replacement process.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Adaptability or versatility

If the cover removal apparatus is added to the opening/closing door, then cover removal function is improved, but the internal space of the apparatus accumulates oxygen

Engineering Contradiction:
Improvecover removal capabilityVSAvoidoxygen accumulation in apparatus
Core Design Contradiction:
Adaptability or versatilityVSObject-affected harmful factors

Solution Approach 1:

The exhaust system is activated before the cover removal apparatus operates, and continues to exhaust during the cover removal process. This preliminary and continuous exhaust action prevents oxygen from accumulating in the internal space of the opening/closing door and cover removal apparatus, maintaining a low-oxygen environment throughout the operation.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If the FOUP is hermetically sealed, then wafer protection is improved, but oxygen exhaust during cover removal becomes insufficient

Engineering Contradiction:
Improvewafer hermetic protectionVSAvoidoxygen exhaustion efficiency
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

The exhaust ports are strategically positioned at specific locations within the wafer conveyance port where oxygen is most likely to accumulate during cover removal. This localized exhaust approach targets the critical areas needing oxygen removal while maintaining the overall hermetic sealing of the FOUP for wafer protection.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables quick and sufficient nitrogen replacement, reducing oxygen concentrations and ensuring optimal processing conditions for semiconductor wafers by effectively exhausting the internal spaces within the cover opening/closing apparatus.

Implementation Method 1

an exhaust system configured to exhaust a space within the accommodation unit

Methodology Applied
Scientific EffectVacuum: Vacuum

Data Source

PatentUS9406537B2Cover opening/closing apparatus, thermal processing apparatus using the same, and cover opening/closing method
Publication Date: 2016.08.02 TOKYO ELECTRON LTD
  • US9406537B2 patent drawing
  • US9406537B2 patent drawing
  • US9406537B2 patent drawing

AI summary

Provided is a cover opening/closing apparatus which includes: a wafer conveyance port having an opening edge and configured to be opened/closed by an opening/closing door; and a cover removal apparatus installed on the opening/closing door and configured to remove a cover of a FOUP which is formed with a substrate outlet having a opening edge. When the cover removal apparatus removes the cover of the FOUP, the opening edge of the substrate outlet is closely contacted with the opening edge of the wafer conveyance port. The cover removal apparatus includes: a latch key which is engaged with the cover of the FOUP, a driving unit configured to drive the latch key, and an accommodation unit configured to accommodate the driving unit. The cover opening/closing apparatus further includes an exhaust system configured to exhaust a space within the accommodation unit.