Field of View Testing via Grid Alignment
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Solution Overview
Problem
Current methods for testing the field of view (FOV) of image output devices, such as head-up displays (HUD) and virtual reality devices, lack accuracy and efficiency in determining the included angle between observation points and image output edges, which is crucial for meeting product requirements.
Innovation Solution
A method and system involving an image acquisition apparatus and a grid line apparatus, where a grid pattern is aligned with a test pattern output by the image output device, allowing for the capture of images to determine the FOV using predetermined formulas, with the grid pattern and test pattern's relationship enabling the calculation of horizontal and vertical FOVs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional FOV testing methods are used, then the testing process is simple, but the measurement precision is insufficient
Solution Approach 1:
A grid line apparatus serves as an intermediary tool between the image output device and the image acquisition apparatus. The grid pattern on the grid line apparatus provides a reference framework that enables precise measurement of the FOV by establishing known geometric relationships in the captured image, thereby improving measurement precision without requiring overly complex testing equipment.
Solution Approach 2:
The testing system is segmented into distinct functional components: the image output device under test, the grid line apparatus with its grid pattern, and the image acquisition apparatus. This segmentation allows each component to perform its specific function independently, making the overall system easier to understand and operate while maintaining high measurement precision through the coordinated interaction of these modular elements.
2Productivity
If traditional FOV testing methods are used, then the device complexity is low, but the productivity is low
Solution Approach 1:
The grid line apparatus is designed to be self-aligning with the image output device. The grid pattern automatically provides reference lines that align with the test pattern output by the image output device, eliminating the need for complex manual alignment procedures and enabling rapid, efficient FOV testing while keeping the system relatively simple to operate.
Solution Approach 2:
The grid pattern is pre-configured on the grid line apparatus with known geometric relationships and scale references. This preliminary preparation of the measurement framework allows for rapid and accurate FOV measurement without requiring complex real-time calculations or adjustments during the testing process, thereby improving productivity.
3Measurement precision
If manual alignment methods are used, then the device complexity is low, but the measurement precision is insufficient
Solution Approach 1:
The grid pattern acts as an intermediary alignment reference between the image output device and the image acquisition apparatus. By providing pre-configured grid lines that intersect at known angles and distances, the grid pattern enables precise automatic alignment of centerlines without requiring complex manual alignment procedures or sophisticated alignment systems.
Data Source
AI summary
Disclosed herein is a method for testing a field of view. The method includes arranging an image acquisition apparatus at a predetermined observation position of an image output device, and arranging a grid line apparatus at a predetermined distance in front of the image acquisition apparatus. The method further includes controlling the image output device to output a test pattern; moving the grid line apparatus, and keeping the distance between the grid line apparatus and the image acquisition apparatus unchanged, such that a centerline of the grid pattern coincides with a centerline of the test pattern. Additionally, included in the method is capturing an image of the grid pattern and the test pattern by the image acquisition apparatus; and determining a field of view of the image output device according to a relationship between the test pattern and the grid pattern in the captured image.