FPGA-Based DUT Simulation Equipment for Flexible Testing
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Solution Overview
Problem
Operating and testing devices under test (DUTs) are costly and prone to damage due to their complexity and high replacement times, with existing solutions lacking flexibility and efficiency in simulating various test features.
Innovation Solution
The use of DUT simulation equipment, comprising a circuit board with a field programmable gate array (FPGA) and a processor, simulates the response performance of a DUT, allowing flexible operation of multiple test features without a physical DUT, reducing costs and minimizing damage risks through per-pin protection and power regulation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a physical DUT is used for testing, then the tester can be operated, but the cost is high and the replacement time is long
Solution Approach 1:
The patent creates a virtual copy of the DUT using FPGA technology that replicates the electrical characteristics and response behaviors of the actual DUT. This virtual model allows the tester to be operated without the physical DUT, eliminating replacement time while maintaining testing capability. The FPGA-based simulation equates to creating a digital twin that can be instantly deployed and modified.
Solution Approach 2:
The FPGA-based DUT simulation equipment can simulate multiple different DUT types and configurations through reconfiguration of the FPGA logic. A single piece of equipment serves as a universal test target for various test scenarios, replacing the need for multiple physical DUTs and reducing replacement time across different testing requirements.
2Reliability
If a physical DUT is used for testing, then the tester can be operated, but the cost is high
Solution Approach 1:
The patent replaces expensive physical DUTs with a cost-effective FPGA-based simulation system. The FPGA device, being a reconfigurable logic device, can be programmed to simulate DUT behavior at a fraction of the cost of actual specialized DUTs. The simulation model can be updated via software without hardware replacement, making it economically sustainable.
Solution Approach 2:
Instead of acquiring and maintaining expensive physical DUTs, the system creates a virtual replica using FPGA technology. This digital copy captures the essential testing characteristics while eliminating the need for costly physical hardware, directly reducing the quantity of substance (cost) while preserving testing capability.
3Adaptability or versatility
If various test features of the tester are operated, then comprehensive testing is achieved, but more types of DUTs are required
Solution Approach 1:
The FPGA-based simulation platform provides universal functionality by reconfiguring the logic to match different DUT behaviors required for various test features. Instead of needing multiple specialized physical DUTs, a single reconfigurable system handles all test scenarios, reducing device complexity while maintaining comprehensive test feature coverage.
Solution Approach 2:
The system dynamically reconfigures the FPGA logic based on the specific test requirements. The simulation model can be changed on-the-fly through software control, allowing the same hardware to adapt to different DUT types and test features without physical replacement, thereby reducing the number of DUT types needed.
4Reliability
If a DUT without protection mechanism is used, then the tester can be operated, but the possibility of damage is high
Solution Approach 1:
The system incorporates protection mechanisms in advance by designing the FPGA-based simulation with built-in safeguards. The virtual nature of the DUT eliminates physical damage risks, and the system includes software-based protection against improper operations. Any erroneous test signals are handled gracefully without causing harm, as the FPGA logic can be designed with inherent protection circuits and error handling.
Data Source
AI summary
Device under test (DUT) simulation equipment includes: a first circuit board including a first field programmable gate array (FPGA); a second circuit board including a processor; and a power distribution board, wherein the first circuit board is connected to the power distribution board, and the power of the first circuit board is supplied by the power distribution board, wherein the second circuit board is connected to the power distribution board, and the power of the second circuit board is supplied by the power distribution board, wherein when the DUT simulation equipment is connected to a tester to perform testing, the DUT simulation equipment simulates the performance of a DUT providing a response signal after receiving a test signal from the tester, and wherein, in the DUT simulation equipment, only the first circuit board receives the test signal from the tester, and the second circuit board controls the first circuit board by means of a control signal.