Configuration Memory Error Logging for FPGA Soft Error Analysis
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Solution Overview
Problem
The miniaturization of semiconductor devices leads to issues with soft errors caused by terrestrial radiation, which are difficult to identify and manage, especially in programmable devices like FPGAs, as they result in malfunctions and data loss, and existing techniques struggle to store and reproduce error information effectively.
Innovation Solution
A programmable device with a configuration memory that includes means for direct reading and writing, error detection, and non-volatile storage of error data, allowing for the identification and retention of error locations and times, even during power off, to enhance reproducibility and reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If configuration memory is used to store logic circuit information in programmable devices, then device functionality and adaptability are improved, but vulnerability to soft errors from terrestrial radiation increases
Solution Approach 1:
The configuration memory is divided into multiple storage units or blocks, each capable of independent error detection and correction. This segmentation allows localized error handling without affecting the entire configuration, thereby maintaining reliability while preserving the adaptability of the programmable device.
Solution Approach 2:
Error detection and correction codes are pre-integrated into the configuration memory structure before the device operates. This preliminary action ensures that errors from terrestrial radiation are detected and corrected before they can cause functional failures, maintaining both reliability and adaptability.
2Volume of moving object
If miniaturization is pursued to reduce device size, then device compactness is improved, but susceptibility to soft errors from radiation increases
Solution Approach 1:
Error protection mechanisms are selectively applied to critical regions of the miniaturized device that are most susceptible to radiation effects. This local quality approach provides targeted protection without increasing overall device size, addressing both compactness and radiation sensitivity.
Solution Approach 2:
The device employs composite structures combining radiation-hardened materials and standard miniaturized components. This composite approach allows the device to maintain small size while specific protective layers or structures mitigate radiation-induced soft errors.
3Reliability
If soft error restoration through restart is implemented, then device operation is recovered, but error cause identification becomes difficult
Solution Approach 1:
The system implements feedback mechanisms that capture and store error information from configuration memory before restoration occurs. This feedback loop preserves diagnostic data about the soft error cause, enabling analysis while still allowing operational recovery through restart.
Solution Approach 2:
Error information and configuration data are copied to persistent storage before restoration operations. This copying ensures that diagnostic information is preserved even when the original configuration is restored, allowing error cause identification while maintaining operational reliability.
4Loss of information
If conventional error storage techniques are used, then general error information is captured, but specific configuration memory error details are lost
Solution Approach 1:
The error storage system is segmented to capture specific details about configuration memory errors, including precise location, type, and context information. This segmented approach preserves both general error information and specific diagnostic details, improving measurement precision while maintaining comprehensive error retention.
Solution Approach 2:
Error information is stored in multiple dimensions or layers of detail, from general error classification to specific configuration memory address and bit information. This multi-dimensional storage approach ensures both comprehensive error retention and high measurement precision for error analysis.
Data Source
AI summary
The present invention aims to provide a programmable device with a configuration memory that can hold the state of the occurrence abnormal situation that is difficult to assume such as a failure occurring in the programmable device due to the terrestrial radiation of the configuration memory, even during power off, in order to improve the reproducibility in device testing based on the held error information. The programmable device with the configuration memory includes: an error detection section for detecting an error in the configuration memory, and outputting the detected error as well as an address in which the error occurred, as error information; and an error information holding section provided with a non-volatile memory to store the output error information.