FPGA Switch Block Leakage Reduction With Mixed-Threshold Transistors

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Solution Overview

Problem

FPGA architectures face significant challenges with high power consumption due to leakage current, especially as technology scales, which hampers their adoption in low-power portable environments and wireless applications, despite efforts like dual threshold approaches that affect timing performance.

Innovation Solution

The introduction of high-voltage transistors in switch blocks, combined with footer transistors and body biasing, reduces leakage current while maintaining timing performance, and the use of super cut-off techniques further minimizes power consumption.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of energy

If high threshold transistors are used to reduce leakage current, then power consumption is reduced, but timing performance deteriorates due to increased delays

Engineering Contradiction:
Improveleakage power consumptionVSAvoidtiming performance
Core Design Contradiction:
Loss of energyVSSpeed

Solution Approach 1:

The patent applies different threshold voltage characteristics to different parts of the switch block circuit. Specifically, the pass-transistors use low threshold voltage for fast switching, while the buffer stage uses high threshold voltage transistors to reduce leakage. This local differentiation allows the circuit to achieve both fast timing performance and low power consumption by optimizing each region for its specific function.

Inventive Principle:
Principle #3Local quality

2Loss of energy

If dual threshold approach is applied to reduce leakage, then static power consumption is reduced, but device complexity increases due to additional circuit elements

Engineering Contradiction:
Improvestatic power consumptionVSAvoidcircuit complexity
Core Design Contradiction:
Loss of energyVSDevice complexity

Solution Approach 1:

The patent combines the dual threshold approach with a buffer stage design that integrates the high threshold transistors into the existing switch block structure. The buffer stage merges the function of signal conditioning with leakage reduction, using high threshold transistors in series with the signal path to block leakage currents while maintaining the same external interface and control logic.

Inventive Principle:
Principle #5Merging (Combining)

3Loss of energy

If high threshold transistors are used throughout the circuit, then leakage power is reduced by two orders of magnitude, but area occupation increases

Engineering Contradiction:
Improveleakage power consumptionVSAvoidsilicon area occupation
Core Design Contradiction:
Loss of energyVSArea of stationary object

Solution Approach 1:

The patent restricts the use of high threshold transistors to only the buffer stage portion of the switch block, while the pass-transistor switching elements continue to use low threshold transistors. This localized application of high threshold devices achieves significant leakage reduction without requiring the entire circuit to be redesigned with larger, high threshold transistors, thus minimizing area overhead.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS7463067B2Switch block for FPGA architectures
Publication Date: 2008.12.09 STMICROELECTRONICS SRL
  • US7463067B2 patent drawing
  • US7463067B2 patent drawing
  • US7463067B2 patent drawing

AI summary

A switch block for FPGA architectures combining hardware and software techniques in order to reduce both active and standby leakage power.