FPGA USB 3.0/3.1 Control Architecture for Flexible PHY Testing
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Solution Overview
Problem
Current USB 3.0/3.1 testing relies heavily on chips, leading to incomplete emulation verification, limited test modes, and unchangeable hardware functions, resulting in a low success rate for USB chip tape out.
Innovation Solution
An FPGA-based USB 3.0/3.1 control system that combines a USB controller soft core with an FPGA Serdes serial communication module, eliminating the need for PHY chips and allowing for flexible hardware configurations, enabling comprehensive testing and emulation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If USB chip-based testing is used, then testing can be performed with existing chip infrastructure, but emulation verification is incomplete and test modes are limited
Solution Approach 1:
The patent creates a virtual USB controller model that replicates the functionality of physical USB controllers in an FPGA environment. This virtual model allows comprehensive emulation verification without requiring actual USB controller chips, thereby improving verification completeness while maintaining test flexibility through software configuration.
Solution Approach 2:
The patent introduces a virtual USB controller as an intermediary layer between the test environment and the Device Under Test (DUT). This virtual controller mediates all USB protocol interactions, enabling complete emulation verification while allowing flexible test mode selection without being constrained by physical chip limitations.
2Reliability
If PHY chips are used for testing, then port physical layer functions can be tested, but the test mode is very limited and vendor availability is restricted
Solution Approach 1:
The patent replaces physical PHY chips with a virtualized PHY layer implementation in FPGA. This substitution eliminates dependency on vendor-specific PHY hardware while maintaining full PHY function testing capability. The virtual PHY can be configured through software to support multiple test modes including USB 2.0, USB 3.0, and various PHY modes (EP, HS, SS), thereby significantly improving test mode variety.
Solution Approach 2:
The patent creates a universal testing platform that can perform PHY function testing across multiple USB standards and modes without requiring different vendor-specific PHY chips. The single FPGA-based system can be reconfigured via software to test USB 2.0 Full Speed, High Speed, USB 3.0 Super Speed, and various PHY operational modes, providing multi-functionality that replaces multiple vendor-specific PHY chip solutions.
3Ease of manufacture
If fixed hardware functions are used in chips, then manufacturing cost is low, but hardware functions cannot be changed
Solution Approach 1:
The patent implements dynamic reconfigurability in the FPGA-based USB controller, allowing hardware functions to be changed through software configuration rather than being fixed during manufacturing. The controller can be reprogrammed to support different USB standards (2.0, 3.0, 3.1), different data rates, and different operational modes, providing adaptability while maintaining cost-effectiveness through a single reconfigurable hardware platform.
Solution Approach 2:
The patent utilizes FPGA reconfiguration capabilities to change hardware parameters dynamically. By modifying configuration bits and register settings, the system can switch between different USB standards, data rates, and operational modes without physical hardware changes. This parameter-based flexibility allows the same hardware to adapt to different testing requirements while maintaining manufacturing cost efficiency.
Data Source
AI summary
An FPGA-based USB3.0/3.1 control system, including: a USB control module including a USB3.0 control module and/or a USB3.1 control module; a PCS logic module connected to the USB control module via a PIPE interface; an FPGA Serdes serial communication module connected to the PCS logic module; and an external daughter card module connected to the FPGA Serdes serial communication module, wherein the PCS logic module, the FPGA Serdes serial communication module and the external daughter card module are connected in sequence to achieve a port physical layer function for testing the USB 3.0 control module and the USB 3.1 control module. The control system solves the cumbersome problems of incomplete emulation verification, test mode limitations, and unchangeable hardware functions in the prior art.