FPGA Voltage Glitch Testing for Precise MCU Vulnerability Detection
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Solution Overview
Problem
Existing methods for testing microcontroller unit (MCU) chips for vulnerabilities are inefficient, lack time accuracy, and require additional costly equipment like oscilloscopes, making them cumbersome and expensive.
Innovation Solution
A test device incorporating a Field Programmable Gate Array (FPGA) chip to control a power supply, generating voltage glitches to test MCUs, with features like high-frequency clock signals and programmable power supplies for precise testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional methods are used to test MCU vulnerabilities, then additional equipment like oscilloscopes is required, but this increases device complexity and cost
Solution Approach 1:
The patent combines the voltage glitch generation function and MCU testing function into a single integrated test device. The FPGA-based control circuit integrates the power supply control and testing capabilities, eliminating the need for separate oscilloscopes and other external equipment, thus reducing device complexity while maintaining vulnerability detection reliability
Solution Approach 2:
The test device is designed with universal functionality to test various types of MCU chips through programmable control. The FPGA-based system can adapt to different MCU configurations and vulnerability types, providing multi-functional testing capabilities without requiring additional specialized equipment for each test scenario
2Measurement precision
If traditional voltage glitch testing is used, then time accuracy is insufficient, but this reduces vulnerability detection precision
Solution Approach 1:
The patent replaces traditional mechanical/electronic timing methods with an FPGA-based digital timing system. The FPGA generates voltage glitches with precise timing control using digital logic, achieving high time accuracy without requiring additional external timing equipment, thus improving both measurement precision and testing efficiency
3Adaptability or versatility
If comprehensive vulnerability testing is implemented, then testing coverage increases, but this increases device complexity and operational complexity
Solution Approach 1:
The test device employs dynamic programmable control through FPGA, allowing the testing configuration to be adapted to different MCU types and vulnerability scenarios. The system can dynamically reconfigure test parameters and sequences based on the target MCU characteristics, providing comprehensive testing coverage while maintaining operational simplicity through automated adaptation
Data Source
AI summary
The present specification discloses a test device, a test system, a test method, and a test apparatus. The test device provided in the present specification includes an FPGA chip capable of controlling a target power supply that supplies power to an MCU under test. In practice, different test logic programs can be configured in the FPGA chip based on actual needs, to satisfy a need of flexibly testing different types of MCUs under test. In addition, the FPGA chip in the test device can be used to generate a high-frequency clock signal, to ensure time accuracy when voltage glitch faults are injected into the MCU under test, so as to further ensure a test effect for the MCU under test.