Frequency-Based Built-In-Test for Discrete Output Signals
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Solution Overview
Problem
Existing methods for testing device under test (DUT) prototypes are impractical, uneconomical, and inefficient, particularly when testing discrete output signals, as they require manual stimulation and measurement of every combination of output states, which is time-consuming.
Innovation Solution
A testing device with a plurality of test output conductors and a control circuit that applies an electrical quantity simultaneously to all conductors, toggling it at unique frequencies to detect disturbances between discrete output signals, allowing for efficient identification of any issues such as short or open circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If manual stimulation and measurement of discrete output signals is used, then testing can be performed on DUT prototypes, but the testing process becomes time-consuming when testing every combination of output state
Solution Approach 1:
The patent applies periodic action by toggling the electrical quantity at unique frequencies for each test output conductor. This periodic toggling enables automatic detection of disturbances through frequency analysis, eliminating the need for manual testing of every output combination and significantly reducing testing time while maintaining comprehensive test coverage
Solution Approach 2:
The testing system performs self-service by automatically detecting disturbances between discrete output signals through the control circuit's ability to monitor the electrical quantity characteristics. The system self-diagnoses issues such as short or open circuits without requiring manual intervention, thereby reducing both testing time and operational complexity
2Reliability
If conventional testing methods are used for DUT prototypes, then testing can be performed, but the process is uneconomical and inefficient
Solution Approach 1:
The patent changes the parameter of the electrical quantity by toggling it at unique frequencies for each test output conductor. This parameter change enables the control circuit to distinguish between different conductors and detect disturbances through frequency analysis, achieving both reliable detection of circuit issues and improved testing efficiency through automated parallel testing
3Extent of automation
If electrical quantity is toggled at unique frequencies for each conductor, then disturbances can be automatically detected, but device complexity increases
Solution Approach 1:
The patent applies segmentation by assigning unique frequencies to each test output conductor individually. This segmentation allows the control circuit to analyze each conductor's electrical quantity characteristics independently through frequency discrimination, enabling automatic disturbance detection while managing complexity through modular frequency assignment rather than requiring complex inter-conductor coordination
Data Source
AI summary
A method is provided for testing discrete output signals of a device-under-test (DUT). The method includes receiving an electrical quantity at each conductive path of a plurality of conductive paths that are each coupled to respective discrete output signals of the DUT in one-to-one correspondence. The method further includes controlling application of the electrical quantity to each of the conductive path independent of application of the electrical quantity along the other conductive paths, so that a the electrical quantity is applied simultaneously to all of the conductive paths, the electrical quantity applied to each conductive path being toggled at a unique frequency having a unique period. Accordingly, a characteristic of the electrical quantity at each of the respective test output conductors over the duration of the longest period of the unique periods is indicative of any disturbance between the discrete output signals associated with the test output conductor and all of the other discrete output signals.