Frequency Selective Surface Integrated Computational Element for Wellbore Fluids
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Solution Overview
Problem
Conventional optical analysis systems for wellbore fluids, such as crude petroleum and gas, require complex and costly fabrication processes for thin film-based integrated computational elements (ICEs), which are fragile and require batch-level calibration, limiting their reliability and scalability for in-situ measurements.
Innovation Solution
The use of frequency-selective surface (FSS) patterns on ICEs, fabricated using conventional photolithography techniques, allows for simpler, cost-effective production and design-level calibration, enabling robust and efficient measurement tools that can operate across a broader spectral range from UV to mid-IR or far-IR.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If thin film-based integrated computational elements (ICEs) are used for optical analysis, then spectral filtering capability is achieved, but fabrication complexity and cost increase
Solution Approach 1:
The patent changes the fundamental parameter of ICE structure from multiple thin dielectric layers to a single substrate with frequency selective surface pattern. This parameter change maintains spectral filtering capability while dramatically simplifying fabrication to conventional photolithography processes, resolving the contradiction between measurement precision and device complexity
Solution Approach 2:
The patent uses frequency selective surface (FSS) patterns that replicate the spectral filtering function of complex thin film stacks. The FSS pattern acts as a simplified copy of the multilayer structure's optical function, achieving the same spectral discrimination with much simpler fabrication geometry
2Measurement precision
If thin film-based ICEs are used, then spectral filtering is achieved, but reliability decreases due to fragility
Solution Approach 1:
The patent changes the structural parameter from fragile thin film layers to a robust single-substrate configuration with surface patterns. This structural parameter change maintains spectral filtering performance while dramatically improving reliability by eliminating the fragility associated with multiple thin dielectric layers
Solution Approach 2:
The patent segments the optical filtering function from the structural substrate, placing the frequency selective surface pattern on a robust substrate. This segmentation allows the substrate to provide mechanical strength while the FSS pattern provides spectral filtering, resolving the contradiction between measurement precision and reliability
3Measurement precision
If thin film-based ICEs are used, then optical analysis capability is achieved, but calibration complexity increases
Solution Approach 1:
The patent changes the calibration parameter from batch-level calibration requirements to design-level calibration. The FSS-based ICE maintains optical analysis capability while requiring only design-level calibration, eliminating the complex batch-level calibration process associated with thin film ICEs
4Ease of manufacture
If conventional photolithography is used for FSS fabrication, then manufacturing cost decreases, but spectral range coverage must be optimized
Solution Approach 1:
The patent applies local quality by using different FSS pattern geometries and dimensions in different regions or for different spectral bands. This allows conventional photolithography to cost-effectively produce ICEs optimized for specific spectral ranges (UV, visible, IR) while maintaining ease of manufacture through standard fabrication processes
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces manufacturing and calibration costs, enhances the reliability and scalability of optical analysis systems, and extends the spectral range of measurement tools, making them more suitable for in-situ analysis of wellbore fluids.
Implementation Method 1
a layer disposed on a surface of the substrate as a frequency-selective surface pattern, where the frequency-selective surface pattern is defined in terms of a set of parameters to be spectrally equivalent to a filter spectrum over the wavelength range
Implementation Method 2
The interaction changes characteristics of the light, specifically the frequency (color), intensity, polarization, and/or direction (e.g., through scattering, absorption or refraction)
Data Source
AI summary
Technologies are described for providing optical analysis systems using an integrated computational element that has a surface patterned to selectively reflect or transmit different wavelengths by differing amounts across a spectrum of wavelengths. In one aspect, a measurement tool contains an optical element including a layer of material patterned so that the optical element selectively transmits or reflects, during operation of the measurement tool, light in at least a portion of a wavelength range by differing amounts, the differing amounts being related to a property of a sample. The wavelength range can include wavelengths in a range from about 0.2 μm to about 100 μm. Additionally, the sample can include wellbore fluids and the property of the sample is a property of the wellbore fluids.