Fourier Transform Light Scattering for Nanometer Cell Imaging

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Solution Overview

Problem

Current light microscopy techniques face limitations in achieving nanometer-level resolution for studying cells without invasive sample preparation, as they rely on exogenous fluorescent dyes and suffer from weak fluorescent light detection, photobleaching, and photo-damage, especially when dealing with transparent samples like cells.

Innovation Solution

The method involves determining the angular scattering distribution of a sample by combining unscattered and scattered light to produce an interference signal, which is then numerically propagated to obtain a quantitative image of the scattering distribution, allowing for phase contrast imaging and dynamic light scattering analysis without exogenous agents.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Illumination intensity

If exogenous fluorescent dyes are used for imaging, then contrast is improved, but photobleaching and photo-damage occur

Engineering Contradiction:
ImprovecontrastVSAvoidphotobleaching and photo-damage
Core Design Contradiction:
Illumination intensityVSReliability

Solution Approach 1:

The method uses intrinsic optical properties of the sample (phase contrast) rather than exogenous fluorescent dyes. The sample itself provides the contrast mechanism through its refractive index variations, eliminating the need for external fluorescent agents that cause photobleaching and photo-damage.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent introduces an intermediary reference beam in the interferometer that does not pass through the sample. This reference beam interferes with the sample-transmitted beam to enhance contrast without requiring the sample to absorb or fluoresce light, thereby avoiding photodamage.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Illumination intensity

If high excitation power is delivered to the sample, then signal strength is improved, but photo-damage increases

Engineering Contradiction:
Improvesignal strengthVSAvoidphoto-damage
Core Design Contradiction:
Illumination intensityVSObject-affected harmful factors

Solution Approach 1:

The patent replaces the mechanical/chemical process of fluorescent excitation with an optical interference process. Instead of relying on high-power excitation to generate fluorescent signal, the system uses interferometry to detect phase shifts, substituting a gentler optical measurement approach.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The reference beam acts as an intermediary that enables signal enhancement without requiring high excitation power on the sample. The interference between reference and sample beams amplifies the signal while the sample itself experiences minimal light intensity.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Illumination intensity

If phase contrast imaging is used, then intrinsic contrast is improved, but quantitative phase information is lost

Engineering Contradiction:
Improveintrinsic contrastVSAvoidquantitative phase information
Core Design Contradiction:
Illumination intensityVSLoss of information

Solution Approach 1:

The patent creates a copy of the phase information through interference with the reference beam. The interferogram contains encoded phase information that can be extracted quantitatively, preserving the original phase data while providing enhanced contrast through the interference process.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The system uses feedback from the interferometer to retrieve quantitative phase information. By measuring the interference pattern and its phase shifts, the system can reconstruct the quantitative phase distribution of the sample, providing both contrast and measurement capability.

Inventive Principle:
Principle #23Feedback

4Measurement precision

If light microscopy is used for nanometer resolution, then resolution is improved, but sample preparation becomes invasive

Engineering Contradiction:
Improvenanometer resolutionVSAvoidinvasive sample preparation
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent substitutes mechanical sectioning and staining procedures with optical interferometry. The quantitative phase imaging technique extracts nanometer-scale structural information through optical phase shifts, eliminating the need for invasive mechanical preparation while maintaining high resolution.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The method uses the sample's own optical properties (refractive index variations) to provide the contrast and structural information needed for nanometer resolution imaging, eliminating the need for external stains or sectioning that would constitute invasive preparation.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables non-invasive, high-resolution imaging and characterization of cells and tissues, providing quantitative phase information and dynamic light scattering data, overcoming the limitations of traditional microscopy techniques.

Implementation Method 1

combining unscattered and scattered light to produce an interference signal

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

analyzing angular scattering over a broad range of angles by a sample

Methodology Applied
Scientific EffectLight scattering: Scattering

Data Source

PatentUS8520213B2Spatial light interference microscopy and fourier transform light scattering for cell and tissue characterization
Publication Date: 2013.08.27 THE BOARD OF TRUSTEES OF THE UNIV OF ILLINOIS
  • US8520213B2 patent drawing
  • US8520213B2 patent drawing
  • US8520213B2 patent drawing

AI summary

Methods and apparatus for rendering quantitative phase maps across and through transparent samples. A broadband source is employed in conjunction with an objective, Fourier optics, and a programmable two-dimensional phase modulator to obtain amplitude and phase information in an image plane. Methods, referred to as Fourier transform light scattering (FTLS), measure the angular scattering spectrum of the sample. FTLS combines optical microscopy and light scattering for studying inhomogeneous and dynamic media. FTLS relies on quantifying the optical phase and amplitude associated with a coherent image field and propagating it numerically to the scattering plane. Full angular information, limited only by the microscope objective, is obtained from extremely weak scatterers, such as a single micron-sized particle. A flow cytometer may employ FTLS sorting.