Fuse Structure With Air Gap For Uniform Programming

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Solution Overview

Problem

Fuses in semiconductor circuits often fail to operate efficiently, particularly when programming current and voltage are low, and may allow undesirably high current flow despite apparent programming.

Innovation Solution

A fuse structure featuring a metal-semiconductor layer on a monocrystalline semiconductor substrate with an air gap between the substrate and the fuse layer, providing enhanced uniformity and thermal control for improved programming performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional fuse structure is used, then the fuse can sever defective circuit portions, but the fuse does not program efficiently under low programming current and voltage conditions

Engineering Contradiction:
Improveprogramming efficiencyVSAvoidprogramming current and voltage
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent changes the physical parameters of the fuse structure by introducing an air gap and using monocrystalline semiconductor material, which alters the thermal and electrical properties to enable efficient programming at lower currents and voltages

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The fuse structure combines different materials (metal-semiconductor layer, monocrystalline semiconductor substrate, air gap) to create a composite structure that leverages the advantageous properties of each material for improved programming efficiency

Inventive Principle:
Principle #40Composite materials

2Reliability

If a conventional fuse structure is used, then the fuse can provide circuit protection, but the fuse allows undesirably high current flow after programming

Engineering Contradiction:
Improvecurrent controlVSAvoidhigh current flow
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The air gap and monocrystalline substrate change the thermal and electrical parameters of the fuse, enabling better control over current flow characteristics after programming to prevent excessively high leakage currents

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If thermal annealing is used to form the metal-semiconductor layer, then the fuse layer can be created, but uniformity is poor without a monocrystalline substrate

Engineering Contradiction:
Improvefuse layer uniformityVSAvoidthermal uniformity during annealing
Core Design Contradiction:
Manufacturing precisionVSStability of the object's composition

Solution Approach 1:

The monocrystalline semiconductor substrate provides a stable thermal field during annealing processes, ensuring uniform heating and consistent metal-semiconductor layer formation across the fuse structure

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The combination of metal layer and monocrystalline semiconductor substrate creates a composite structure where the crystalline substrate ensures uniform thermal distribution during processing, resulting in consistent fuse layer properties

Inventive Principle:
Principle #40Composite materials

4Reliability

If no air gap is present, then the fuse structure is simpler, but thermal control and programming performance are reduced

Engineering Contradiction:
Improveprogramming performanceVSAvoidfuse structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The air gap acts as a thermal intermediary that isolates and concentrates heat in the fuse layer during programming, enabling precise thermal control and improved programming performance

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The air gap segments the thermal path, creating distinct thermal zones that allow independent control of the fuse layer temperature, improving programming precision despite added structural complexity

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables more uniform and efficient programming of the fuse layer, reducing the risk of high current flow and improving overall fuse performance by utilizing a monocrystalline semiconductor substrate and an air gap for precise thermal control.

Implementation Method 1

the inclusion of a gap interposed between the monocrystalline semiconductor material layer and the substrate provides for more uniform thermal control (i.e., and a resulting enhanced thermal gradient)

Methodology Applied
Scientific EffectThermal insulation: Thermal Insulation

Implementation Method 2

Use of a monocrystalline semiconductor material layer as a fuse substrate layer provides enhanced uniformity, in particular, of a metal-semiconductor layer fuse when fabricating the metal-semiconductor layer fuse while using a particular thermal annealing method

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS7713792B2Fuse structure including monocrystalline semiconductor material layer and gap
Publication Date: 2010.05.11 X CORP
  • US7713792B2 patent drawing
  • US7713792B2 patent drawing
  • US7713792B2 patent drawing

AI summary

A fuse structure, a method for fabricating the fuse structure and a method for programming a fuse within the fuse structure each use a fuse material layer that is used as a fuse, and located upon a monocrystalline semiconductor material layer in turn located over a substrate. At least part of the monocrystalline semiconductor material layer is separated from the substrate by a gap. Use of the monocrystalline semiconductor material layer, as well as the gap, provides for enhanced uniformity and reproducibility when programming the fuse.