Semiconductor Fuse Array Bank Selection and Code Alignment
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Solution Overview
Problem
As the amount of data to be repaired in semiconductor devices increases, the space occupied by circuits for performing rupture and read operations on fuses becomes significant, leading to inefficiencies in semiconductor memory devices.
Innovation Solution
A semiconductor device with multiple fuse arrays, a selection block, a code alignment block, and an operation block that enables the selection and operation of a single fuse array based on a repair code, allowing for efficient rupture and read operations by controlling the number of fuses and data bits according to the selected array.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple fuse arrays are used to repair more data, then the repair capacity increases, but the device complexity and space occupation increase
Solution Approach 1:
The fuse array is divided into multiple banks (first bank, second bank, third bank, fourth bank), each capable of independent operation. This segmentation allows the system to handle larger repair capacities by distributing fuses across multiple banks while maintaining manageable complexity through modular organization and selective activation of individual banks based on repair needs.
Solution Approach 2:
The semiconductor device incorporates a unified control structure that can operate on any of the multiple fuse banks using the same control signals and circuitry. The repair control unit and operation blocks are designed to universally control any selected bank, reducing overall device complexity while maintaining high adaptability for different repair scenarios.
2Adaptability or versatility
If more fuse arrays are enabled to handle increased repair data, then the repair capability improves, but the space occupied by control circuits increases
Solution Approach 1:
Multiple fuse banks share common control circuits including the repair control unit, operation blocks, and selection logic. Instead of having separate control circuits for each bank, the design merges control functions so that a single set of control circuits can manage any selected bank through the bank selection signals, significantly reducing the total space occupied by control circuits while maintaining full repair capability across all banks.
3Measurement precision
If fuse arrays are selected based on repair code bits, then the operation precision improves, but the code alignment complexity increases
Solution Approach 1:
The system performs preliminary bank selection based on specific bits of the repair code before executing the actual repair operations. The bank selection signals are generated in advance from the repair code bits, allowing the system to pre-configure which bank will be operated on. This preliminary action simplifies the overall code alignment process by separating the bank selection step from the subsequent operation execution, reducing complexity while maintaining precise control.
Data Source
AI summary
A semiconductor device includes: a plurality of fuse arrays each including a plurality of fuses; a selection block which selects one fuse array among the fuse arrays in response to values of a group of bits of a repair code; a code alignment block which aligns disposition of bits other than the group of bits of the repair code, wherein the alignment disposition is changed based on the fuse array selected in the selection block; and an operation block which controls an operation of the fuse array selected in the selection block in response to a repair command and an output code of the code alignment block.