Semiconductor Fuse Array Boot-Up Voltage Adjustment
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Solution Overview
Problem
Semiconductor devices face challenges in performing effective boot-up operations and reliably reading fuse data due to variations in process, voltage, and temperature (PVT) variations, which can lead to unintentional values and failure in boot-up processes, especially when relying on predetermined control codes without adjustment mechanisms.
Innovation Solution
A semiconductor device with a fuse array that includes verification fuses and normal fuses, a determination block for comparing read values with predetermined values, and a level control block to adjust the read reference voltage, allowing for repeated operations based on comparison signals to ensure proper voltage levels for reliable data reading during boot-up.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If a predetermined control code is used for boot-up operations, then the boot-up process can be simplified, but the system becomes vulnerable to PVT variations causing unintentional values and boot-up failures
Solution Approach 1:
The patent dynamically adjusts the read reference voltage parameter during boot-up operations based on detected PVT variations. The level control block modifies the reference voltage level in response to comparison results between read data and predetermined values, allowing the system to adapt to changing conditions and maintain reliable operation without complex manual intervention
Solution Approach 2:
The patent implements a feedback mechanism where the determination block continuously compares read data from verification fuses against predetermined values and feeds this information back to the level control block. This closed-loop feedback system enables automatic adjustment of the read reference voltage to compensate for PVT variations, ensuring reliable boot-up operations
2Reliability
If separate large-area fuses or e-fuses are used for control code storage, then control code storage is reliable, but the area occupancy increases
Solution Approach 1:
The patent merges the control code storage function into the existing fuse array structure used for other purposes. By utilizing the same fuse array for both data storage and control code storage, the patent eliminates the need for separate dedicated storage elements, thereby reducing overall area occupancy while maintaining reliability through the unified array's verification mechanism
Solution Approach 2:
The fuse array is designed to serve multiple functions: storing control codes, storing data, and providing verification capabilities. This multi-functional design allows the same physical structure to perform various roles, eliminating the need for separate dedicated components and reducing total area requirements while maintaining system reliability
Data Source
AI summary
A semiconductor device includes a fuse array including verification fuses and normal fuses, a determination block suitable for reading data programmed in the verification fuses based on a read reference voltage and during a boot-up preparation section, determining whether or not a read value is the same as a predetermined value, and a level control block suitable for adjusting a level of the read reference voltage based on a determined result during the boot-up preparation section.