Fuse Array Readout for Automated Redundancy Set Counting
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Solution Overview
Problem
Current semiconductor devices lack an efficient method to calculate the number of used or unused fuse sets during the boot-up mode, which is crucial for identifying defective memory cells and implementing redundancy, as existing methods are cumbersome and not fully automated.
Innovation Solution
A semiconductor device design that includes a fuse selection circuit, a fuse array, a read circuit, and a calculation circuit, which generate fuse set address signals, read set data, and calculate the number of used or unused fuse sets based on a clock signal and fuse information signals, allowing for sequential selection and analysis of fuse regions and sets.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Extent of automation
If manual methods are used to track fuse set usage, then flexibility is maintained, but productivity and automation are reduced
Solution Approach 1:
The fuse array is divided into multiple fuse sets, each capable of storing redundancy information. The calculation circuit is segmented to count used and unused fuse sets separately, enabling automated tracking without requiring complex centralized management.
Solution Approach 2:
The calculation circuit automatically counts the number of used and unused fuse sets by itself during boot-up mode, without requiring external manual intervention or complex external control systems. The circuit performs self-assessment of fuse set status.
2Reliability
If comprehensive fuse set tracking is implemented, then reliability is improved, but manufacturing complexity increases
Solution Approach 1:
The fuse sets are pre-configured with redundancy information before operation. During boot-up mode, the calculation circuit performs preliminary counting of used and unused fuse sets, preparing the system for efficient defect management without requiring complex real-time analysis.
Solution Approach 2:
Manual tracking methods are replaced with an automated calculation circuit that uses electrical signals and logical operations to count fuse set status. This substitution of mechanical/manual processes with electronic automation improves reliability while maintaining manufacturing simplicity.
3Measurement precision
If sequential reading of fuse sets is performed, then measurement precision is improved, but time consumption increases
Solution Approach 1:
The calculation circuit continuously counts the number of used and unused fuse sets during the sequential reading process in boot-up mode. This continuous counting occurs concurrently with the reading operation, ensuring no time is lost and maintaining measurement precision throughout the process.
Solution Approach 2:
The sequential reading of fuse sets is performed systematically during boot-up mode, with the calculation circuit prepared in advance to count used and unused sets. This preliminary preparation and systematic execution ensure accurate detection without unnecessary time delays.
Data Source
AI summary
A semiconductor device includes a fuse selection circuit suitable for generating fuse set address signals based on a clock signal; a fuse array including a plurality of fuse sets and suitable for sequentially outputting fuse set data from the fuse sets based on the fuse set address signals; a read circuit suitable for sequentially generating read set data based on the clock signal and the fuse set data; and a calculation circuit suitable for calculating a number of used or unused fuse sets among the fuse sets based on the clock signal and a fuse information signal which includes at least one fuse read signal among a plurality of fuse read signals included in the read set data.