Semiconductor Fuse Array Voltage Generation Segmentation
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Solution Overview
Problem
Semiconductor devices face challenges in generating high voltages for fuse arrays and internal circuits without degrading the durability and reliability of either component, particularly due to the high rupture voltage required for fuse operations.
Innovation Solution
A semiconductor device design that includes separate voltage generation blocks for generating different target levels of voltages, with a connection control block to disconnect and reconnect voltage lines based on operation periods, ensuring that the fuse array and internal circuit operate independently and minimize mutual impact.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If a single high voltage source is used for both fuse array and internal circuit, then the fuse array can be programmed, but the internal circuit's durability and reliability are degraded
Solution Approach 1:
The voltage generation circuit is divided into two separate blocks: a first voltage generation block for generating internal circuit voltage and a second voltage generation block for generating fuse array programming voltage. This segmentation allows each block to operate independently at its required voltage level without affecting the other, thus enabling fuse programming while maintaining internal circuit reliability.
Solution Approach 2:
A connection control block acts as an intermediary between the two voltage generation blocks and the respective circuits. It selectively connects or disconnects the voltage lines based on operation mode, ensuring that high programming voltage is only introduced to the fuse array when needed, while the internal circuit is protected from voltage spikes during normal operation.
2Reliability
If separate voltage generation blocks are used for fuse array and internal circuit, then both can operate independently, but the device complexity increases
Solution Approach 1:
The connection control block serves multiple functions: it acts as a switch to isolate voltage lines during programming operations, and as a connector during normal operations. This multi-functionality reduces the need for additional separate circuits, thereby limiting the increase in device complexity while maintaining operational independence.
Solution Approach 2:
The connection control block dynamically adjusts the connectivity between voltage generation blocks and circuits based on the current operation mode (programming vs. normal operation). This dynamic control allows the system to adapt its configuration rather than requiring fixed separate connections, simplifying the overall circuit design.
3Ease of manufacture
If high rupture voltage is applied to fuse array, then fuse programming is enabled, but the internal circuit's durability is degraded
Solution Approach 1:
The voltage generation circuit is divided into two separate blocks: a first voltage generation block for generating internal circuit voltage and a second voltage generation block for generating fuse array programming voltage. This segmentation allows each block to operate independently at its required voltage level without affecting the other, thus enabling fuse programming while maintaining internal circuit reliability.
Solution Approach 2:
A connection control block acts as an intermediary between the two voltage generation blocks and the respective circuits. It selectively connects or disconnects the voltage lines based on operation mode, ensuring that high programming voltage is only introduced to the fuse array when needed, while the internal circuit is protected from voltage spikes during normal operation.
Data Source
AI summary
A semiconductor device that includes a fuse array including a plurality of fuses, and suitable for operating using a fuse operation voltage in a fuse operation period, a first voltage generation block suitable for generating an internal voltage based on a first target level, a second voltage generation block suitable for generating the fuse operation voltage based on a second target level in the fuse operation period, and generating the fuse operation voltage based on the first target level outside the fuse operation period, and a connection control block suitable for disconnecting a line of the internal voltage and a line of the fuse operation voltage in the fuse operation period, and connecting the line of the internal voltage and the line of the fuse operation voltage outside the fuse operation period.


