Fuse Blowing Method for DRAM Auto-Repair
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Solution Overview
Problem
Current methods for auto-repairing memory circuits in integrated circuits, particularly DRAM arrays, are inefficient as they require human intervention to identify and repair damaged sections, which slows down the process.
Innovation Solution
A fuse blowing method and system that automatically detects voltage thresholds across word lines in a memory circuit, sending an enabling signal to blow a fuse connected to a damaged memory cell, thereby switching to a redundant section for memory storage, utilizing a voltage detector, fuse circuit, and address storing circuit to facilitate autonomous repair.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If human operators manually identify and repair damaged memory sections, then repair accuracy can be ensured, but the repair process time increases significantly
Solution Approach 1:
The memory system performs self-diagnosis and self-repair by automatically detecting damaged sections through voltage monitoring and autonomously blowing fuses to switch to redundant sections, eliminating the need for human operators while maintaining high precision through automated detection circuits
Solution Approach 2:
The system continuously monitors voltages on word lines and uses this feedback information to automatically identify damaged sections. When a voltage deviation is detected, the system responds by activating the fuse blowing circuit to repair the damage, creating a closed-loop self-correcting system that ensures accurate damage detection and timely repair
2Productivity
If automated fuse blowing is implemented, then repair speed increases, but system complexity increases due to additional detection circuits
Solution Approach 1:
The voltage detection circuit serves multiple functions: it monitors word line voltages during normal operation, detects damaged sections when voltage deviations occur, and provides signals for the fuse blowing circuit. This multi-functionality reduces the need for separate dedicated detection circuits, thereby limiting the increase in system complexity while enabling automated repair
Solution Approach 2:
The patent combines the damage detection function and the repair control function into an integrated automated system. The voltage detector and fuse blowing circuit are merged into a coordinated system where detection signals directly trigger repair actions, reducing the number of separate components and simplifying the overall system architecture while maintaining high repair speed
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid and autonomous detection and repair of damaged memory cells, improving the efficiency of memory auto-repair processes by automatically identifying and replacing faulty sections with redundant ones, reducing downtime and human intervention.
Implementation Method 1
detecting a plurality of voltages of a plurality of word lines; sending an enabling signal to a fuse circuit when one of the voltages is below a voltage threshold
Implementation Method 2
blowing a fuse, in which the fuse is connected to the one of the word lines
Data Source
AI summary
A fuse blowing method is disclosed. The fuse blowing method comprises the following operations: detecting a plurality of voltages of a plurality of word lines; sending an enabling signal to a fuse circuit when one of the voltages is below a voltage threshold, in which the one of the voltages corresponds to one of the word lines; and blowing a fuse, in which the fuse is connected to the one of the word lines, such that the one of the voltages is higher than the voltage threshold.