Fuse Circuit With Dummy Cell For Sense Amplifier Verification
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Solution Overview
Problem
Existing fuse circuits in semiconductor devices face challenges in reducing area usage and efficiently detecting whether a sense amplifier operates properly, particularly due to the need for large transistors or amplifiers for data recognition in anti-fuse cells.
Innovation Solution
A fuse circuit design that includes a data line, selectively programmed fuse cells, a dummy fuse cell with a resistor, and a sense amplifier to sense data, allowing for area reduction and easy verification of the sense amplifier's operation through a test signal and comparison with a reference voltage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a large transistor or amplifier is used to recognize fuse data, then data recognition capability is improved, but circuit area increases
Solution Approach 1:
The fuse array is divided into multiple banks (first bank, second bank, etc.), each with its own fuse cells. This segmentation allows parallel processing of fuse data across different banks, improving recognition capability without requiring a single large amplifier. Each bank can be independently sensed, distributing the measurement load and reducing the area requirement for individual sensing components.
Solution Approach 2:
A dummy fuse cell is introduced as an intermediary element for testing the sense amplifier operation. The dummy fuse cell includes a controllable resistance element that can simulate different fuse states (cut or uncut). This intermediary testing mechanism allows verification of the sense amplifier without requiring additional large amplifiers, as the dummy cell provides a known reference state for comparison.
2Measurement precision
If multiple amplifiers are used to sense fuse data, then sensing accuracy is improved, but device complexity increases
Solution Approach 1:
The sense amplifier is designed to serve multiple functions: it senses data from fuse cells in different banks, it tests itself using the dummy fuse cell, and it can operate in different testing modes. This multi-functionality eliminates the need for separate amplifiers for different purposes, reducing the total number of amplifiers while maintaining sensing accuracy across all fuse banks.
Solution Approach 2:
The sense amplifier performs self-testing through the dummy fuse cell mechanism. By controlling the resistance element in the dummy fuse cell to different states, the sense amplifier can verify its own operation without requiring external testing equipment or additional amplifiers. This self-service capability reduces device complexity by eliminating redundant testing components.
3Ease of manufacture
If laser programming is used for fuse, then data programming capability is improved, but post-package programming capability deteriorates
Solution Approach 1:
The invention uses anti-fuse cells that change their resistance parameter from high (uncut state) to low (cut state) through electrical programming. This parameter change approach allows programming to be performed electrically rather than requiring laser processing, enabling both pre-package and post-package programming operations. The resistance change in anti-fuse cells provides a versatile programming mechanism that adapts to different manufacturing stages.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution reduces the area required for the fuse circuit and facilitates easy verification of the sense amplifier's operation, ensuring reliable data sensing and storage without the need for large transistors or multiple amplifiers.
Implementation Method 1
coupling a resistor with a data line of the fuse circuit in response to the test signal to supply a pull-up voltage to the data line through the resistor
Implementation Method 2
comparing a voltage of the data line with a reference voltage to output a data
Data Source
AI summary
A fuse circuit includes a data line, a plurality of fuse cells selectively programmed and electrically connected with the data line in response to respective selection signals, a dummy fuse cell electrically connected with the data line in response to a test signal, and a sense amplifier configured to sense a data of the data line. The fuse circuit includes a plurality of fuses, reduces the area thereof, and easily detects whether a sense amplifier operates properly or not in the fuse circuit.