Fuse Cutting Test Circuit for Incomplete Break Detection

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Solution Overview

Problem

Conventional fuse cutting test methods in semiconductor storage devices face challenges in detecting incomplete fuse breaking, leading to unstable signal outputs and longer testing times, especially with high-speed SRAM products that require slow-rise fault detection.

Innovation Solution

A fuse cutting test method and circuit that measure the current flowing through the fuse to determine its state, using a current supply, comparison circuit, and determination circuit to output signals indicating whether the fuse is broken, unbroken, or incompletely cut, thereby distinguishing between switched and unswitched states.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional fuse cutting test methods are used, then the testing process is simple, but incomplete fuse breaking cannot be detected leading to unstable signal outputs

Engineering Contradiction:
Improvefuse state detection precisionVSAvoidtest circuit complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The test circuit is segmented into distinct functional modules: a current supply unit that provides test current, a measurement unit that measures the voltage drop across the fuse, and a determination unit that compares the measured voltage against reference values. This segmentation allows each module to perform its specific function efficiently, improving measurement precision while keeping the overall system manageable through modular design.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a measurement unit as an intermediary between the fuse and the determination unit. This intermediary measures the voltage drop across the fuse and converts it into a comparable signal, enabling precise detection of incomplete fuse breaking without requiring direct complex interaction between the fuse and the control system.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If slow-rise fault detection is performed in high-speed SRAM products, then incomplete fuse breaking can be detected, but testing time increases

Engineering Contradiction:
Improvefault detection reliabilityVSAvoidtesting time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent replaces the mechanical/time-based slow-rise detection method with an electrical measurement approach. Instead of gradually raising power supply voltage over time to detect faults, the system applies test current and measures voltage drop instantaneously, achieving reliable fault detection without the time penalty of slow-rise testing.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the detection parameter from time-based voltage rise rate to instantaneous voltage drop magnitude. By measuring the voltage drop across the fuse under test current and comparing it against reference values, the system can reliably detect incomplete fuse breaking in a single instant rather than requiring extended slow-rise testing periods.

Inventive Principle:
Principle #35Parameter changes

3Productivity

If current measurement method is used, then rapid and precise fuse state detection is achieved, but additional circuit elements are introduced

Engineering Contradiction:
Improvetesting speedVSAvoidcircuit element quantity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The measurement unit serves multiple functions: it measures voltage drop across the fuse, converts the measurement into a comparable signal, and provides input to the determination unit. This multi-functionality reduces the need for separate dedicated components for each function, achieving rapid detection while minimizing the increase in circuit element quantity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent merges the current supply, voltage measurement, and fault determination functions into an integrated test circuit system. The current supply unit, measurement unit, and determination unit work together as a unified system, allowing rapid fuse state detection while avoiding the complexity of separate independent circuits for each function.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for rapid and precise detection of fuse states without lengthening testing times, providing stable results and minimizing interference from other elements, and can be applied to various semiconductor applications.

Implementation Method 1

When a fuse is not broken completely, the fuse functions as a high-resistance

Methodology Applied
Scientific EffectElectrical Resistance: Electrical Resistance

Data Source

PatentUS7573273B2Fuse cutting test circuit, fuse cutting test method, and semiconductor circuit
Publication Date: 2009.08.11 RENESAS ELECTRONICS CORP
  • US7573273B2 patent drawing
  • US7573273B2 patent drawing
  • US7573273B2 patent drawing

AI summary

A fuse cutting test method to test the state of a fuse includes measuring the current flowing through the fuse and determining the fuse to be either broken, or not broken, or in a state therebetween, based on the measured current.