Fuse Memory Circuit with Shared Programming and Diode Isolation

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

As memory cells become smaller and more complex, the resistance of conductive lines within these devices are affected, impacting their performance, and existing non-volatile memory technologies face challenges in efficiently storing data while minimizing circuit area.

Innovation Solution

A memory circuit design that incorporates fuse elements configured in high or low resistance states for data storage, shared programming devices to reduce area, and diodes to prevent unintended current paths, thereby improving performance and reducing circuit size.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If memory cells are made smaller and more complex, then storage capacity increases, but resistance of conductive lines changes affecting performance

Engineering Contradiction:
Improvestorage capacityVSAvoidperformance
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent transitions from planar 2D memory cell layouts to vertically stacked 3D structures, stacking multiple memory cell layers above a common substrate. This dimensional change increases storage capacity without proportionally increasing footprint area, and the vertical architecture provides better control over conductive line resistance through shortened current paths and improved material utilization.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Duration of action of stationary object

If non-volatile memory technologies are used for data storage, then data retention is improved, but circuit area increases

Engineering Contradiction:
Improvedata retentionVSAvoidcircuit area
Core Design Contradiction:
Duration of action of stationary objectVSArea of stationary object

Solution Approach 1:

The patent merges multiple memory cell layers into a single vertical stack sharing common bit lines and word line structures. This consolidation provides non-volatile data retention across multiple layers while reducing the overall circuit footprint by eliminating redundant conductive lines that would otherwise be required for separate memory cells.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The stacked memory architecture uses shared bit lines and control circuits that serve multiple memory cell layers simultaneously. This multi-functionality enables non-volatile storage across several layers while using a single set of read/write circuitry, thereby reducing the total circuit area compared to implementing separate non-volatile memory cells for each layer.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Area of stationary object

If programming devices are shared among multiple fuse elements, then area is reduced, but device complexity increases

Engineering Contradiction:
Improvecircuit areaVSAvoidcircuit complexity
Core Design Contradiction:
Area of stationary objectVSDevice complexity

Solution Approach 1:

The patent segments the programming operation into controlled phases using selection devices that activate specific fuse elements or groups. Each programming device is paired with selection transistors that segment the programming current paths, allowing multiple fuse elements to share programming devices while maintaining simple individual programming operations through selective activation.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The proposed design effectively stores data in a non-volatile manner while significantly reducing the memory circuit's overall area by up to 40% and enhances performance by preventing unintended current paths.

Implementation Method 1

fuse elements configured as non-volatile memory and configured in a high resistance state or a low resistance state

Methodology Applied
Scientific EffectElectrical Resistance: Electrical Resistance

Implementation Method 2

a diode connected in series with the fourth fuse element, wherein the diode blocks a current flow through the fourth fuse element

Methodology Applied
Scientific EffectDiode rectification: Diode

Data Source

PatentUS20250266113A1Memory circuit and method of operating same
Publication Date: 2025.08.21 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20250266113A1 patent drawing
  • US20250266113A1 patent drawing
  • US20250266113A1 patent drawing

AI summary

A method of operating a memory circuit includes turning on a first programming device and turning on a first selection device thereby causing a first current to flow through a first fuse element. The first fuse element is coupled between the first selection device and the first programming device. The method further includes turning off a second programming device and turning off a second selection device, and blocking the first current from flowing through a second fuse element that is coupled between the second selection device and the first programming device.