Fuse Protection Circuit for Memory Devices

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Solution Overview

Problem

Memory devices with fuses are susceptible to unintentional programming due to electro-static discharge (ESD) currents, which can alter the stored data without intended programming.

Innovation Solution

Incorporating a fuse protection circuit that includes a detector and switches to connect the ESD current to ground, preventing unintentional programming by decoupling the program lines and word lines from the supply line during an ESD event.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the memory device uses fuses to store data, then data storage capability is achieved, but the device becomes susceptible to unintentional programming due to ESD currents

Engineering Contradiction:
Improvedata integrityVSAvoidESD current susceptibility
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent introduces a protection circuit as an intermediary component between the ESD protection circuit and the fuse. This protection circuit includes detection circuitry that monitors for ESD events and switching circuitry that isolates the fuse from ESD currents. The intermediary protection circuit allows legitimate programming signals to pass through while blocking harmful ESD currents, thus resolving the contradiction between maintaining data storage functionality and protecting against ESD-induced unintentional programming.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent implements preliminary protective measures by detecting ESD events before they can reach the fuse and by pre-configuring switching elements to block ESD currents. The detection circuitry continuously monitors for ESD conditions and activates protection mechanisms in advance, preventing ESD currents from causing unintentional programming while allowing normal operation to proceed uninterrupted.

Inventive Principle:
Principle #9Preliminary anti-action

2Reliability

If ESD protection circuitry is added to protect the fuse, then reliability against ESD is improved, but device complexity increases

Engineering Contradiction:
ImproveESD protection capabilityVSAvoidcircuit structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The protection circuit is designed to perform multiple functions within a single integrated structure. The same detection circuitry identifies both ESD events and controls switching elements to provide protection. The switching elements serve dual purposes of isolating the fuse during ESD events and enabling normal programming operations. This multi-functionality approach provides comprehensive ESD protection without proportionally increasing device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The protection circuit is designed to be self-regulating through feedback mechanisms. The detection circuitry automatically detects ESD conditions and triggers the switching elements to activate protection without requiring external control. The circuit self-manages the protection state based on real-time monitoring of ESD conditions, reducing the need for additional control logic and simplifying the overall device architecture.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Effectively prevents the unintentional programming of fuses in memory devices by discharging ESD currents to ground, ensuring data integrity and reliability.

Implementation Method 1

detecting an electro-static discharge (ESD) current that flows through one of the supply line and the program line

Methodology Applied
Scientific EffectElectro-static discharge: Electrostatic Discharge

Implementation Method 2

coupling a second program line to a ground when the detector detects the ESD current, thereby discharging the ESD current

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Data Source

PatentUS10991442B2Memory device with a fuse protection circuit
Publication Date: 2021.04.27 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US10991442B2 patent drawing
  • US10991442B2 patent drawing
  • US10991442B2 patent drawing

AI summary

A memory device includes a memory circuit and a fuse protection circuit. The memory circuit includes a program line and a fuse. The program line is configured to receive a program voltage for programming the fuse. The fuse protection circuit is coupled to the memory circuit and is configured to prevent unintentional programming of the fuse.