Fuse Reading Circuit Time-Division Multiplexing
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Solution Overview
Problem
Existing fuse reading circuits require multiple reading circuits to read data from a large number of fuse circuits, leading to increased circuit size and inefficiency, especially when dealing with settings that require a small number of bits.
Innovation Solution
A fuse reading circuit with a selector circuit that sequentially selects multiple fuse circuits, allowing a single reading circuit to read information from all fuse circuits, and storage circuits to output the read information in parallel, reducing the overall circuit size.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple reading circuits are provided to read data from multiple fuse circuits, then the reading capability is improved, but the circuit size increases
Solution Approach 1:
The patent combines multiple reading operations into a single reading circuit by using a selector circuit to time-division multiplex the reading function. Instead of having separate reading circuits for each fuse circuit, one reading circuit serves all fuse circuits sequentially through the selector circuit, reducing the overall circuit size while maintaining reading capability.
Solution Approach 2:
The single reading circuit is designed to perform multiple functions by reading different fuse circuits at different times through the selector circuit's control. This universal reading circuit can read data from any of the multiple fuse circuits, eliminating the need for dedicated reading circuits for each fuse circuit.
2Quantity of substance
If the number of fuse circuits is increased to store more data, then the storage capacity is improved, but the number of reading circuits must also be increased
Solution Approach 1:
The reading circuit is designed as a universal component that can read any of the multiple fuse circuits through the selector circuit's time-division multiplexing. This allows the system to increase storage capacity by adding more fuse circuits without proportionally increasing the number of reading circuits, as the single reading circuit serves all fuse circuits sequentially.
3Quantity of substance
If a non-volatile memory is used to store large amounts of setting data, then the storage capacity is improved, but it is not efficient for small amounts of data
Solution Approach 1:
The patent changes the storage parameter by using fuse circuits with programmable resistance states (0 or 1) instead of traditional non-volatile memory. This allows efficient storage of small amounts of data (a few tens of bits) using the fuse circuit's resistance states, avoiding the inefficiency of using non-volatile memory for such small data sizes while still providing non-volatile storage capability.
Data Source
AI summary
Correction data is written in fuse circuits of q bits. A reading circuit sequentially reads information of the fuse circuits through a selector and writes the information in a storage circuit. Therefore, read data is output from the storage circuit in parallel.