Fuse Repair Information Validation for Defective Memory Cells
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Solution Overview
Problem
Existing semiconductor apparatuses face inefficiencies in determining the validity of repair information for defective memory cells, leading to potential abnormal operations due to undetected fuse defects, which can result in incorrect repair operations.
Innovation Solution
A repair information processing circuit and semiconductor apparatus that includes a preliminary repair information storage circuit with a fuse set for storing preliminary repair information and defect check information, utilizing an error calculation circuit to generate a validity determination bit, which determines whether the fuse set has a defect, thereby preventing incorrect repair operations by setting the corresponding fuse set to an unavailable state.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If repair information is stored in a fuse set without defect detection, then the repair operation can be performed, but the system may operate abnormally due to undetected fuse defects
Solution Approach 1:
The patent applies preliminary action by detecting fuse defects before performing repair operations. The defect detection circuit checks whether fuses are properly ruptured before using the stored repair information, ensuring that only valid repair data is used. This preliminary detection prevents abnormal operations while maintaining system reliability.
Solution Approach 2:
The patent introduces an intermediary defect detection circuit that acts as a mediator between the fuse set storing repair information and the repair operation execution. This intermediary layer validates the integrity of repair information by detecting fuse defects, thereby preventing direct use of potentially faulty repair data without significantly increasing overall system complexity.
2Reliability
If defect check information is stored in addition to repair information, then fuse defects can be detected, but the storage capacity for repair information is reduced
Solution Approach 1:
The patent applies segmentation by dividing the fuse set into two functional segments: one portion stores repair information (defective cell addresses) while another portion stores defect check information (validity flags). This segmentation allows simultaneous storage of both repair data and validation data, enabling defect detection without completely sacrificing repair information capacity.
Solution Approach 2:
The patent implements local quality by assigning different functions to different portions of the fuse set. Specifically, certain fuse bits are dedicated to storing repair information while other fuse bits are designated for defect check information. This local differentiation optimizes the use of fuse resources by giving each segment its specific quality or function.
3Productivity
If all fuse sets are used for storing repair information, then maximum storage capacity is achieved, but defect detection capability is lost
Solution Approach 1:
The patent applies partial action by using only a portion of the fuse set for defect detection purposes while reserving the remaining fuses for storing repair information. This partial allocation allows the system to achieve both defect detection capability and adequate repair information storage capacity, rather than requiring all fuses to be dedicated to a single function.
Data Source
AI summary
Disclosed may be a repair information storage circuit. The repair information storage circuit may include a fuse set. A plurality of fuses included in the fuse set may be allocated to the respective bits of preliminary repair information and defect check information. The fuse allocated to the defect check information may be ruptured to store information on whether the fuse set has a defect.