Fused Imaging Device for Defect Detection
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Solution Overview
Problem
Conventional light sources are inadequate for capturing high-quality images of industrial products with diverse surface materials and defects, such as reflective, transparent, or black surfaces, and are not compatible with various environments, leading to reduced accuracy in defect detection.
Innovation Solution
A fused imaging device and method that uses a plurality of light sources controlled by a processor to apply customizable optimal lighting configurations, adjusting incidence angles, patterns, and wavelengths to illuminate the target object, and captures multiple images to generate a target image, improving defect detection accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single conventional light source is used, then the device complexity is low, but the image quality and defect detection accuracy deteriorate when capturing products with diverse surface materials and defects
Solution Approach 1:
The light source is segmented into multiple independent controllable light sources (e.g., multiple LEDs or laser beams) that can be individually controlled. Each light source can be independently adjusted in terms of intensity, angle, and wavelength to optimize illumination for specific surface materials and defect types, thereby improving defect detection accuracy without requiring a completely complex system redesign
Solution Approach 2:
The light sources are made dynamic and adjustable rather than fixed. The system can dynamically change the illumination parameters (intensity, angle, wavelength) based on the detected product characteristics and defect types. This dynamic adaptability allows the system to maintain high measurement precision across diverse applications while managing complexity through software control rather than hardware complexity
2Adaptability or versatility
If a single fixed lighting configuration is used, then the device operation is simple, but the adaptability to different surface materials and environments deteriorates
Solution Approach 1:
The light source system is designed with multi-functionality to handle various surface materials (reflective, transparent, black/opaque) and defect types (scratches, dirt, surface defects) with a single integrated system. By incorporating multiple light sources with different characteristics and adjustable parameters, the system achieves universal applicability across different industrial inspection scenarios without requiring separate specialized lighting systems for each material type
Solution Approach 2:
The system utilizes parameter changes in the light sources (intensity, angle, wavelength) to adapt to different surface materials and environments. By dynamically adjusting these parameters based on the detected product characteristics, the system maintains high adaptability while simplifying operation through automated parameter optimization rather than manual configuration
3Measurement precision
If multiple light sources with customizable lighting configurations are used, then the image quality and defect detection accuracy improve, but the device complexity increases
Solution Approach 1:
The system incorporates self-service capabilities where the control component automatically selects and adjusts lighting configurations based on the detected product characteristics and defect types. Rather than requiring manual intervention to configure complex lighting setups, the system autonomously optimizes the multiple light sources, thereby improving image quality while reducing the operational complexity burden on the user
Data Source
AI summary
A fused imaging device and method are disclosed. The device comprises a light source component, an image capture component, and a control component. The control component may be configured to control the light source component to illuminate a target object based on a preset plurality of first optimal lighting configurations. The control component may further control the image capture component to capture images of the target object to obtain multiple first images, under the illumination of the light source component and generate a target image of the target object, based on the first images. The control component may further adjust the incidence angle, pattern, and wavelength of the light source in the light source component, as well as the exposure, lens focus, and polarization of the image capture component, to detect target object defects in captured images of the target object.