GaN Transistor Fault Triggered Diode Emulation Mode

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Solution Overview

Problem

Wide bandgap transistors like GaN lack an inherent body diode, leading to third quadrant operation when turned off, resulting in high power dissipation and potential damage due to unintended current flow, which complicates thermal shutdown protocols.

Innovation Solution

Implementing a fault triggered diode emulation mode that controls the transistor to allow current flow in one direction and restrict it in the opposite direction, preventing third quadrant mode and reducing power dissipation during over-temperature faults.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If wide bandgap transistors are used for high voltage power switching, then power conversion capability is improved, but third quadrant operation causes high power dissipation and potential damage

Engineering Contradiction:
Improvepower conversion capabilityVSAvoidpower dissipation
Core Design Contradiction:
PowerVSLoss of energy

Solution Approach 1:

The patent applies inversion by detecting third quadrant operation conditions (negative voltage and positive current) and responding with an inverted control action - enabling the transistor instead of leaving it off. This counterintuitive approach allows the transistor to conduct current in the reverse direction through its channel rather than through the body diode, significantly reducing power dissipation during fault conditions.

Inventive Principle:
Principle #13The other way round (Inversion)

Solution Approach 2:

The patent changes the operating parameters of the transistor by transitioning it from an off state to an on state during third quadrant conditions. By modifying the gate voltage parameter, the transistor's channel conductivity changes, enabling it to handle reverse current with much lower resistance and thus reducing power dissipation from P=I²R.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If the transistor is turned off during fault conditions, then current flow is restricted, but third quadrant operation causes unintended current flow and potential damage

Engineering Contradiction:
Improvefault protectionVSAvoidunintended current flow
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent implements feedback by continuously monitoring the voltage and current parameters of the transistor to detect third quadrant operation conditions. When negative voltage and positive current are detected simultaneously, the control circuit responds by enabling the transistor, creating a closed-loop control system that adapts to fault conditions and prevents harmful effects.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent converts the harmful third quadrant operation into a beneficial state by enabling the transistor to deliberately conduct current in the reverse direction. What would normally be a damaging unintended current flow becomes a controlled and managed current path through the transistor channel, transforming a harmful effect into a protected operating mode.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Reliability

If diode emulation mode is enabled during faults, then current flow direction is controlled, but device complexity increases

Engineering Contradiction:
Improvecurrent direction controlVSAvoidcontrol circuit complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies universality by using the same transistor to perform multiple functions - both its normal switching operation and its diode emulation function during faults. The transistor's ability to conduct current in both directions when enabled allows it to serve as both a power switch and a controlled diode, eliminating the need for separate diode components and reducing overall device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS11621551B2Methods, apparatus, and systems to facilitate a fault triggered diode emulation mode of a transistor
Publication Date: 2023.04.04 TEXAS INSTRUMENTS INC
  • US11621551B2 patent drawing
  • US11621551B2 patent drawing
  • US11621551B2 patent drawing

AI summary

Methods, systems, and apparatus to facilitate a fault triggered diode emulation mode of a transistor. An example apparatus includes a driver to output a control signal to a gate terminal of a transistor of a power converter; and a diode emulation control circuit to, in response to determining a fault corresponding to the transistor, enable the transistor when current flows in a direction from a source terminal of the transistor to a drain terminal of the transistor.