Gallium Nitride Dipole Layer for Gate Work Function Control

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Solution Overview

Problem

Conventional CMOS devices face challenges with doped polysilicon gate electrodes, such as gate depletion and non-ideal effective work function, which become complex and impractical in advanced node applications, necessitating alternative materials for improved performance.

Innovation Solution

The use of a cyclical deposition process to form a dipole layer comprising gallium nitride over a gate dielectric in semiconductor structures, which can include additional metal-containing layers, to modulate the effective work function and threshold voltage of MOS devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If doped polysilicon is used as gate electrode material, then the device can be manufactured with conventional processes, but gate depletion occurs and effective work function is non-ideal

Engineering Contradiction:
ImprovemanufacturabilityVSAvoidgate depletion and work function performance
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent uses a composite gate electrode structure consisting of multiple metal layers (e.g., titanium nitride, tungsten, cobalt) combined with dielectric materials. This composite approach allows optimization of both electrical properties (work function, depletion) and manufacturability, replacing the single-material polysilicon gate with a multi-layer structure that addresses the limitations of conventional materials.

Inventive Principle:
Principle #40Composite materials

2Productivity

If gate oxide thickness is reduced for advanced node applications, then device density and speed improve, but gate depletion region becomes significant

Engineering Contradiction:
Improvedevice density and speedVSAvoidgate depletion effect
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent changes the material parameters of the gate electrode from doped polysilicon to metal-based materials with different electrical characteristics. This parameter change (material composition, work function, carrier concentration) allows maintaining effective gate control even with reduced oxide thickness, preventing the gate depletion region from becoming significant while enabling advanced node scaling.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If threshold voltage adjustment implantation is used to overcome non-ideal effective work function, then work function can be adjusted, but process complexity increases

Engineering Contradiction:
Improveeffective work functionVSAvoidprocess complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent performs preliminary action by selecting metal materials with inherently suitable work functions for the desired device type (NMOS or PMOS). Instead of starting with a generic polysilicon gate and adjusting it later through complex implantation processes, the gate material is pre-selected to have the appropriate electrical characteristics, simplifying the overall manufacturing process while maintaining reliable work function control.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The gallium nitride dipole layer induces a significant threshold voltage shift, improving the performance of MOS devices by altering the band alignment and providing a more ideal work function, suitable for advanced node applications.

Implementation Method 1

performing one or more cycles of a cyclical deposition process to deposit a dipole layer comprising gallium nitride over a surface of the gate dielectric. The cyclical deposition process can include (e.g., sequentially and separately) providing a gallium precursor to the reaction chamber and providing a nitrogen reactant to the reaction chamber.

Methodology Applied
Scientific EffectChemical Vapour Deposition: Chemical Vapour Deposition

Data Source

PatentUS20230215728A1Methods for forming a semiconductor structure including a dipole layer
Publication Date: 2023.07.06 ASM IP HLDG BV
  • US20230215728A1 patent drawing
  • US20230215728A1 patent drawing
  • US20230215728A1 patent drawing

AI summary

Methods for forming a semiconductor structure including a gallium nitride dipole layer are disclosed. An exemplary method includes using a cyclical deposition process to deposit a dipole layer comprising gallium nitride over a surface of a gate dielectric. The cyclical deposition process can include providing a gallium precursor to the reaction chamber and separately providing a nitrogen reactant to the reaction chamber. The cyclical deposition process may desirably be a thermal cyclical deposition process. Exemplary structures can include field effect transistor structures, such as gate all around structures.