Galvo Scanner Attenuation Optic for Aberration-Free Beam Profiling

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Solution Overview

Problem

Existing galvo scanner systems face challenges in profiling high-power laser beams across large scan fields without introducing beam aberrations, due to the high power levels and angular movements of the laser beams.

Innovation Solution

A system comprising an attenuation optic with two meniscus lenses, tilted at a fixed angle of incidence, and a pixelated detector, which attenuates the laser beam without introducing aberrations, allowing for precise profiling of the laser beam across the scan field.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a pixelated detector is used to profile the laser beam, then the beam profile can be measured, but the detector can only handle microwatts of power while industrial lasers operate at watts to kilowatts levels

Engineering Contradiction:
Improvebeam profile measurementVSAvoidlaser power handling capability
Core Design Contradiction:
Measurement precisionVSPower

Solution Approach 1:

The patent introduces an attenuation optic as an intermediary element between the high-power laser beam and the pixelated detector. This attenuation optic reduces the laser power to a level the detector can handle while maintaining beam profile accuracy. The intermediary component enables measurement of high-power beams without directly exposing the detector to damaging power levels.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Power

If attenuation techniques are applied to reduce laser power, then the beam can be measured by the detector, but undesirable beam aberrations are introduced

Engineering Contradiction:
Improvelaser power reductionVSAvoidbeam profile accuracy
Core Design Contradiction:
PowerVSManufacturing precision

Solution Approach 1:

The patent employs parameter changes by using an attenuation optic with specific optical properties (anti-reflective coatings, precise geometry) that minimize aberrations. The attenuation optic is designed with parameters optimized to reduce power while maintaining beam quality, thereby achieving power reduction without significant degradation of measurement accuracy.

Inventive Principle:
Principle #35Parameter changes

3Area of stationary object

If a non-telecentric optical design is used, then the scan field can be larger, but the laser beam becomes elliptical at extreme angles due to tilting

Engineering Contradiction:
Improvescan field sizeVSAvoidbeam shape
Core Design Contradiction:
Area of stationary objectVSShape

Solution Approach 1:

The patent applies local quality by positioning the attenuation optic at a specific location in the optical path where it can compensate for angular variations. The attenuation optic is designed to maintain consistent optical properties across different beam angles, ensuring that beam profile measurements remain accurate even at extreme scan angles where the beam would otherwise become elliptical.

Inventive Principle:
Principle #3Local quality

4Shape

If a telecentric optical design is used to maintain beam shape, then the beam remains round, but the system becomes much more optically complex and the scan field becomes much smaller

Engineering Contradiction:
Improvebeam shapeVSAvoidoptical system complexity
Core Design Contradiction:
ShapeVSDevice complexity

Solution Approach 1:

The attenuation optic serves as a simplified intermediary solution that achieves beam shape preservation without requiring a complex telecentric optical design. By placing this single optical element at a strategic position, the system maintains beam profile accuracy while avoiding the complexity and reduced scan field associated with full telecentric designs.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system enables accurate profiling of high-power laser beams across large scan fields without introducing aberrations, allowing for precise measurement and control of the laser beam, even at extreme angles.

Implementation Method 1

The first meniscus lens has a first surface with a radius of curvature and a highly reflective coating positioned to face the focused laser beam source

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 2

a second surface opposite the first surface with a radius of curvature and an antireflection coating

Methodology Applied
Scientific EffectAntireflection: Anti-Reflective Coating

Implementation Method 3

The first meniscus lens is tilted at a fixed angle of incidence relative to an optical axis of the focused laser beam

Methodology Applied
Scientific EffectRefraction: Refraction

Data Source

PatentUS12313454B2System and method for profiling a laser beam over a galvanometer scan field
Publication Date: 2025.05.27 HAAS LASER TECH
  • US12313454B2 patent drawing
  • US12313454B2 patent drawing
  • US12313454B2 patent drawing

AI summary

A system and method for profiling a focused laser beam of a galvanometer scanner which includes an attenuation optic, wherein the attenuation optic includes a first meniscus lens to face the focused laser beam source, wherein the first meniscus lens is tilted at a fixed angle of incidence relative to an optical axis of the focused laser beam and a second meniscus lens between the first meniscus lens and a pixelated detector, wherein the second meniscus lens is tilted at substantially the same fixed angle of incidence relative to the optical axis of the focused laser beam as the first meniscus lens and is rotated about 90° relative to the first meniscus lens.