Integrated GaN Gate Pulldown Circuit to Prevent False Turn-On

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Solution Overview

Problem

Gallium Nitride (GaN) based switches, particularly Gate Injection Transistors (GITs), are susceptible to unintentional turning on due to noise or voltage perturbations, requiring complex gate-drive circuitry with negative voltages that slow switching speed, introduce inconsistent transition times, and increase losses, making it difficult to reliably maintain a non-conducting state.

Innovation Solution

A failsafe pulldown circuit integrated with the power switch on the same semiconductor die, using a normally-on pulldown transistor and pulldown control circuit to autonomously apply and discharge a negative voltage, preventing unintended turning on by shorting the gate to the source unless a turn-on voltage is applied, thus eliminating the need for negative gate voltage and simplifying the driver circuitry.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If complex gate-drive circuitry with negative voltage is used to hold GIT off, then reliability of non-conducting state is improved, but switching speed deteriorates and device complexity increases

Engineering Contradiction:
Improvereliability of non-conducting stateVSAvoidswitching speed
Core Design Contradiction:
ReliabilityVSSpeed

Solution Approach 1:

The patent extracts the negative voltage generation function from the main gate drive circuitry by using the intrinsic body diode of the GIT. The body diode's forward voltage drop naturally provides the negative voltage needed to hold the gate off, eliminating the need for separate negative voltage generation circuits and reducing overall device complexity while maintaining reliability.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The GIT's own body diode is utilized to generate the negative voltage required for holding the gate off. This self-service approach uses the device's inherent characteristics rather than external circuitry, simplifying the overall system while ensuring reliable off-state holding without compromising switching speed.

Inventive Principle:
Principle #25Self-service

2Ease of operation

If RC circuit with negative voltage is used to drive GIT, then transition control is improved, but transition time consistency deteriorates

Engineering Contradiction:
Improvetransition controlVSAvoidtransition time consistency
Core Design Contradiction:
Ease of operationVSLoss of time

Solution Approach 1:

The patent changes the control parameter from complex RC timing circuits to direct voltage level control. By using well-defined voltage thresholds (0V for off, positive voltage for on), the transition control becomes more consistent and predictable, eliminating the variability introduced by RC time constants and negative voltage dissipation.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If negative voltage is applied to gate during turn-off, then margin above threshold is improved, but switching losses increase

Engineering Contradiction:
Improvemargin above thresholdVSAvoidswitching losses
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The patent converts the body diode's forward voltage drop, which would normally be considered a loss, into a beneficial negative voltage source for holding the gate off. This approach maintains adequate margin above the threshold voltage while avoiding the additional switching losses associated with active negative voltage generation circuits.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Data Source

PatentUS10720913B1Integrated failsafe pulldown circuit for GaN switch
Publication Date: 2020.07.21 INFINEON TECH AUSTRIA AG
  • US10720913B1 patent drawing
  • US10720913B1 patent drawing
  • US10720913B1 patent drawing

AI summary

Circuits and devices are provided for reliably holding a normally-off Gallium Nitride (GaN) power transistor, such as a Gate Injection Transistor (GIT), in a non-conducting state when a gate of the power transistor is not driven with an active (turn-on) control signal. This is accomplished by coupling a normally-on pulldown transistor between the gate and the source of the power transistor, such that the pulldown transistor shorts the gate to the source when the power transistor is not set for its conducting state. The pulldown transistor is preferably located on the same semiconductor die as, and in close proximity to, the power transistor, so as to avoid spurious noise at the power transistor gate that may unintentionally turn on the power transistor. A pulldown control circuit is coupled to the gate of the pulldown transistor and autonomously turns off the pulldown transistor when the power transistor is set to conduct.