GaN Epitaxial Layer Transfer with Protection Layer Planarization

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Solution Overview

Problem

In the fabrication of GaN-based power semiconductor devices, the detachment process using laser lift-off technology often damages the epitaxial structure, leading to increased leakage current and reduced breakdown voltage due to the formation of a rough detaching surface.

Innovation Solution

A method involving the formation of an epitaxial layer with a first transition layer, a protection layer, and an active structure layer, where the protection layer is formed to cover the active structure layer partially, and the first transition layer is etched to create a planarization surface, reducing structural damage during detachment and enhancing the semiconductor's performance by minimizing leakage current and increasing breakdown voltage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If laser lift-off process is used to detach the growth substrate, then the epitaxial layer can be transferred to the transfer substrate, but the epitaxial structure is damaged causing increased leakage current and reduced breakdown voltage

Engineering Contradiction:
Improvetransfer efficiencyVSAvoidleakage current and breakdown voltage
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

A protection layer is formed on the epitaxial structure before the laser lift-off process. This protective measure is taken in advance to prevent damage to the active structure layer during the subsequent detachment process, thereby maintaining the integrity of the epitaxial structure while enabling successful transfer to the transfer substrate

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The protection layer acts as an intermediary between the laser lift-off process and the active structure layer. It absorbs the laser energy and provides mechanical protection during detachment, preventing direct damage to the active structure layer while allowing the transfer process to proceed

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If the protection layer is formed to protect the active structure layer, then structural damage is reduced, but the manufacturing process becomes more complex

Engineering Contradiction:
Improvestructural integrityVSAvoidmanufacturing process steps
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The epitaxial structure is segmented into functional layers: the active structure layer, the protection layer, and the first transition layer. This segmentation allows the protection layer to be formed as a separate component that can be independently optimized for its protective function while maintaining the overall structure's functionality

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The first transition layer is designed with specific material parameters (laser energy absorption characteristics) that allow it to be selectively removed during the laser lift-off process. This parameter optimization enables the protection layer to remain intact while facilitating the detachment process

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method effectively reduces the damage to the epitaxial structure during detachment, thereby decreasing leakage current and increasing breakdown voltage, improving the performance of GaN-based power semiconductor devices.

Implementation Method 1

detaching the growth substrate by a laser lift-off process

Methodology Applied
Scientific EffectLaser: Laser

Implementation Method 2

a laser energy of the laser lift-off process is greater than a band gap energy of the first transition layer

Methodology Applied
Scientific EffectLaser ablation: Laser Ablation

Data Source

PatentUS20240079232A1Semiconductor structure and method for manufacturing semiconductor structure
Publication Date: 2024.03.07 ENKRIS SEMICON
  • US20240079232A1 patent drawing
  • US20240079232A1 patent drawing
  • US20240079232A1 patent drawing

AI summary

Disclosed are a semiconductor structure and a method for manufacturing a semiconductor structure, the method includes: forming a first transition layer, a protection layer and an active structure layer sequentially epitaxially on a side of a growth substrate, where a surface, away from the growth substrate, of the first transition layer is a two-dimensional flat surface; on a first plane, an orthographic projection of the active structure layer is at least partially covered by an orthographic projection of the protection layer, and the first plane is perpendicular to an arrangement direction of the protection layer and the active structure layer; detaching the growth substrate by a laser lift-off process, to make the epitaxial layer transferred to a transfer substrate; etching the first transition layer up to the protection layer, to make a surface, away from the active structure layer, of the protection layer to be a planarization surface.