GaN Substrate Carbon Removal via Oxidation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The existing methods for polishing gallium nitride substrates, which use diamond as a loose abrasive and wax for fixing, result in residual carbon on the substrate surface, leading to poor crystal quality and decreased emission intensity in optical devices.
Innovation Solution
A gallium nitride substrate is developed with a GaLα/CKα peak intensity ratio of not less than 2, as measured by energy dispersive X-ray microanalysis, to minimize residual carbon on the surface, thereby enhancing the crystal quality of the epitaxial growth layer and improving emission intensity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If diamond is used as loose abrasive for polishing GaN substrate, then polishing effect is achieved, but residual carbon remains on substrate surface
Solution Approach 1:
The patent extracts and removes the harmful carbon components from the substrate surface through specific cleaning treatments. The cleaning process selectively removes residual carbon from diamond abrasive and wax without damaging the GaN substrate, thereby eliminating the harmful factor while preserving the polishing quality.
Solution Approach 2:
The patent employs strong oxidizing agents such as ozone or peroxide in the cleaning treatment to accelerate the oxidation and removal of residual carbon on the substrate surface. This chemical oxidation process effectively eliminates carbon contaminants that mechanical cleaning cannot remove, solving the contradiction between achieving polish and avoiding carbon residue.
2Ease of manufacture
If wax is used for fixing GaN substrate during polishing, then substrate is secured, but carbon component from wax remains on surface
Solution Approach 1:
The patent extracts and removes the harmful carbon components from the substrate surface through specific cleaning treatments. The cleaning process selectively removes residual carbon from diamond abrasive and wax without damaging the GaN substrate, thereby eliminating the harmful factor while preserving the polishing quality.
Solution Approach 2:
The patent employs strong oxidizing agents such as ozone or peroxide in the cleaning treatment to accelerate the oxidation and removal of residual carbon on the substrate surface. This chemical oxidation process effectively eliminates carbon contaminants that mechanical cleaning cannot remove, solving the contradiction between achieving polish and avoiding carbon residue.
3Manufacturing precision
If GaN substrate is polished using conventional methods, then surface flatness is improved, but crystal quality of epitaxial growth layer deteriorates
Solution Approach 1:
The patent extracts and removes the harmful carbon components from the substrate surface through specific cleaning treatments. The cleaning process selectively removes residual carbon from diamond abrasive and wax without damaging the GaN substrate, thereby eliminating the harmful factor while preserving the polishing quality.
Solution Approach 2:
The patent employs strong oxidizing agents such as ozone or peroxide in the cleaning treatment to accelerate the oxidation and removal of residual carbon on the substrate surface. This chemical oxidation process effectively eliminates carbon contaminants that mechanical cleaning cannot remove, solving the contradiction between achieving polish and avoiding carbon residue.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The reduced residual carbon on the substrate surface results in improved crystal quality and increased emission intensity of optical devices, reducing failures and enhancing yield.
Implementation Method 1
energy dispersive X-ray microanalysis (EDX) of a surface of the gallium nitride substrate using a scanning electron microscope (SEM)
Data Source
AI summary
A method of processing a gallium nitride substrate, includes providing a gallium nitride substrate, polishing a surface of the gallium nitride substrate, and cleaning the polished surface of the gallium nitride substrate. The polished surface includes a GaLα/CKα peak intensity ratio in energy dispersive X-ray microanalysis (EDX) spectrum which is not less than 2, the EDX spectrum being obtained in an EDX of the surface of the gallium nitride substrate using a scanning electron microscope (SEM) at an accelerating voltage of 3 kV.

