Gas Analysis for Chemical Vapor Infiltration Endpoint Detection

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Solution Overview

Problem

FT-IR spectroscopy is sensitive and requires significant maintenance, often breaking down or providing inaccurate results in dynamic composite reactions.

Innovation Solution

A system and method for producing carbon materials with electrochemical modifiers, using a porous carbon production system, double fines removal system, and chemical vapor infiltration system to determine process completion by measuring silicon absorption values based on inert gas, hydrogen concentration, and total density values.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If FT-IR spectroscopy is used to analyze composite reactions, then measurement capability is provided, but device reliability deteriorates due to sensitivity and maintenance requirements

Engineering Contradiction:
Improvemeasurement capabilityVSAvoiddevice reliability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent extracts the measurement function from the complex FT-IR spectroscopy device and implements it through simpler, more reliable sensors (mass flow sensors, temperature sensors, pressure sensors) that can independently measure reaction parameters without the complexity and maintenance burden of FT-IR equipment

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent creates a simplified measurement system that copies the essential measurement capability of FT-IR spectroscopy using alternative, more robust sensing technologies that provide comparable analytical information through different physical principles

Inventive Principle:
Principle #26Copying

2Measurement precision

If FT-IR spectroscopy is used in dynamic composite reactions, then analysis is performed, but manufacturing precision deteriorates due to breakdown and inaccurate results

Engineering Contradiction:
Improveanalysis accuracyVSAvoidprocess control accuracy
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent implements real-time feedback control by continuously monitoring reaction parameters (mass flow, temperature, pressure) with simple sensors and using this data to dynamically adjust process conditions, ensuring consistent product quality without the measurement errors that plague FT-IR in dynamic conditions

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The measurement system serves itself by using robust, maintenance-free sensors that require no calibration or adjustment during operation, eliminating the hands-on work and maintenance that compromise FT-IR performance in dynamic composite reactions

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Provides accurate and reliable analysis of composite material completion by reducing the need for manual intervention and maintaining the integrity of the analysis process.

Implementation Method 1

chemical vapor infiltration system to determine process completion by measuring silicon absorption values

Methodology Applied
Scientific EffectChemical vapor deposition: Chemical Vapour Deposition

Data Source

PatentUS20250299843A1Gas analysis systems, methods, and reactors
Publication Date: 2025.09.25 GROUP14 TECHNOLOGIES INC
  • US20250299843A1 patent drawing
  • US20250299843A1 patent drawing
  • US20250299843A1 patent drawing

AI summary

Methods, systems, and reactors for chemical vapor infiltration reaction endpoint determination. A system includes a user interface device to enter an inert gas quantity inputted to a reactor, an output device, a hydrogen sensor configured to generate a hydrogen concentration value, a total density sensor configured to generate a total density value, and a processor coupled to the user interface device, the output device, the hydrogen sensor, and the total density sensor. The processor receives the inert gas quantity, the hydrogen concentration value, and the total density value, determines a silicon absorption value based on the received values, generates a signal in response to the silicon absorption value being at or above a predetermined threshold value, and sends the generated signal to the output device. The output device outputs an indication in response to receiving the signal.