Gas Analysis Device with Oblique Sidewalls and Piezoelectric Controller

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Solution Overview

Problem

Existing gas analysis devices face challenges in downsizing and precise adjustment of optical path length, which complicates the structure and hinders accuracy due to the need for nanometer-order adjustments of mirror distances for resonance.

Innovation Solution

A compact gas analysis device design featuring a base with oblique sidewalls, a window with stacked films for adjustable reflectance, and a piezoelectric optical path length controller allows for easy adjustment of optical path length and enhanced accuracy without mechanical complexity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a pair of opposing mirrors are arranged to multiply reflect light, then the optical path length can be lengthened and analysis accuracy can be increased, but the device structure becomes complex and downsizing is difficult

Engineering Contradiction:
Improveanalysis accuracyVSAvoiddevice structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent merges the light source and detector into a single integrated optical component that can be positioned at the end of the optical path. This integration simplifies the overall device structure by eliminating the need for separate light source and detector assemblies, while still achieving the desired optical path length through multiple reflections between mirrors.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent employs a nested configuration where the optical path is folded back on itself multiple times within a compact space. The light travels between opposing mirrors in a multi-reflection path that effectively nests the optical trajectory within the device housing, achieving long optical path length in a small physical footprint.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Measurement precision

If the optical path length is set to an integer multiple of the wavelength for light resonance, then the analysis accuracy can be further increased, but nanometer-order adjustment of the distance between mirrors is required which is difficult to achieve

Engineering Contradiction:
Improveanalysis accuracyVSAvoidadjustment difficulty
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent introduces a movable mirror mount that allows dynamic adjustment of the mirror position along the optical axis. This mechanical degree of freedom enables the optical path length to be tuned to satisfy the resonance condition (integer multiple of wavelength) by simply moving the mirror mount, eliminating the need for complex nanometer-order adjustments of fixed mirror distances.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the adjustable parameter from the distance between opposing mirrors to the position of a single movable mirror mount. This parameter change simplifies the adjustment mechanism while still allowing the optical path length to be precisely controlled to achieve the desired resonance condition for enhanced analysis accuracy.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The design enables precise control of optical path length, increasing analysis accuracy and facilitating downsizing, eliminating the need for mechanical adjustment mechanisms and reducing costs.

Implementation Method 1

an optical path length controller that is located between the base and the window and has a controllable thickness

Methodology Applied
Scientific EffectPiezoelectric effect: Piezoelectric Effect

Implementation Method 2

a window that is located at a side of the base at which the concave portion is open, and includes a first film, and a second film that is stacked with the first film and has a different refractive index than the first film

Methodology Applied
Scientific EffectOptical interference: Interference

Implementation Method 3

a gas analysis device that irradiates light on a sample gas and performs an analysis by utilizing the absorption by the sample gas of a portion of the energy of the irradiated light

Methodology Applied
Scientific EffectAbsorption spectroscopy: Absorption Spectroscopy

Data Source

PatentEP3957978B1Gas analysis device
Publication Date: 2022.09.07 KK TOSHIBA
  • EP3957978B1 patent drawingFigure 1~2
  • EP3957978B1 patent drawingFigure 3
  • EP3957978B1 patent drawingFigure 4A~4C

AI summary

According to one embodiment, a gas analysis device includes: a base having a plate shape and including a concave portion open at one surface of the base; a window that is located at a side of the base at which the concave portion is open, and includes a first film, and a second film that is stacked with the first film and has a different refractive index than the first film; an optical part that is located at a side of the window opposite to the base side and includes a light projector and a light receiver, or the optical part includes a light projector/receiver; and an optical path length controller that is located between the base and the window and has a controllable thickness. The concave portion includes a first sidewall that is oblique to a surface of the base at which the concave portion is open, and a second sidewall that faces the first sidewall and is oblique to the surface at which the concave portion is open. An oblique direction of the second sidewall is opposite to an oblique direction of the first sidewall. When the optical part includes the light projector and the light receive, the light projector is configured to irradiate light toward the first sidewall, and the light receiver is configured to convert light reflected by the second sidewall into an electrical signal. When the optical part includes the light projector/receiver, the light projector/receiver is configured to irradiate light toward the first sidewall, and convert reflected light from the first sidewall into an electrical signal after the irradiation of the light is stopped.