Gas Analyzer Plasma Cleaning for Insulating Deposit Buildup

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Solution Overview

Problem

Gas analyzers used in semiconductor manufacturing processes face challenges in maintaining accuracy and durability due to deposition of insulating films and oxides, which impair potential distribution and functionality, especially in environments with silicon-based gases.

Innovation Solution

A gas analyzer apparatus with a plasma cleaning function, utilizing a control unit to set cleaning potentials for drawing in plasma for cleaning purposes, including the use of a plasma generation unit to generate cleaning plasma, which can be either ground or negative potential, to effectively remove deposits from the ionization, filter, and detector units.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the gas analyzer operates continuously in semiconductor manufacturing environments, then monitoring capability is maintained, but insulating films and oxides deposit on internal components, impairing potential distribution and functionality

Engineering Contradiction:
Improvemonitoring capabilityVSAvoiddeposition of insulating films
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The system performs preliminary cleaning actions by applying cleaning potentials to components before deposits significantly impair functionality. The control unit monitors operational time and automatically applies cleaning potentials to the ionization unit, filter unit, and detector unit to prevent insulating film accumulation that would otherwise degrade monitoring capability.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The gas analyzer implements periodic cleaning cycles where the control unit alternates between normal monitoring mode and cleaning mode. During cleaning mode, cleaning potentials are applied to components for a predetermined time period, then the system returns to monitoring mode. This periodic action prevents deposit accumulation while maintaining continuous monitoring capability.

Inventive Principle:
Principle #19Periodic action

2Reliability

If cleaning potentials are applied frequently to remove deposits, then functionality is maintained, but energy consumption increases

Engineering Contradiction:
ImprovefunctionalityVSAvoidenergy consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The control unit incorporates feedback mechanisms that monitor operational time, detected gas concentrations, and cleaning effectiveness. Based on this feedback, the system dynamically adjusts the frequency and duration of cleaning potential application, applying cleaning only when necessary to maintain functionality while minimizing energy consumption from excessive cleaning cycles.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system applies cleaning potentials at partial intervals rather than continuously or at every operational cycle. The control unit determines optimal cleaning timing based on operational duration and detected deposit levels, applying cleaning action only when it becomes necessary to maintain functionality, thereby reducing overall energy consumption while preserving reliability.

Inventive Principle:
Principle #16Partial or excessive action

3Reliability

If cleaning potentials are applied to all components including the housing, then cleaning effectiveness is improved, but the risk of damage to sensitive components increases

Engineering Contradiction:
Improvecleaning effectivenessVSAvoidcomponent damage risk
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The system applies cleaning potentials selectively to specific components based on their individual cleaning needs and sensitivity to electrical stress. The control unit applies cleaning potentials to the ionization unit, filter unit, and detector unit at different times or with different potential levels, rather than applying uniform high potentials to all components simultaneously, thereby maintaining cleaning effectiveness while reducing damage risk to sensitive elements.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The control unit applies cleaning potentials in a controlled sequence that cushions sensitive components from excessive electrical stress. By applying potentials gradually and in predetermined sequences rather than simultaneously at maximum levels, the system prevents sudden electrical shocks that could damage sensitive components while still achieving effective cleaning of all surfaces including the housing.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The plasma cleaning function ensures the gas analyzer apparatus remains functional and accurate by regularly removing insulating deposits, maintaining optimal potential distribution and extending the apparatus' durability and monitoring capabilities in diverse gas environments.

Implementation Method 1

a plasma generation unit that generates plasma; a cleaning control unit that draws in the generated plasma and controls the plasma cleaning

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 2

a control unit that controls respective potentials of the filter unit, the detector unit, and the housing. The cleaning control unit sets the respective potentials of the filter unit, the detector unit, and the housing to cleaning potentials for drawing in, as plasma for cleaning purposes

Methodology Applied
Scientific EffectElectrostatics: Electrostatics

Data Source

PatentUS12153017B2Gas analyzer apparatus and method for controlling gas analyzer apparatus
Publication Date: 2024.11.26 ATONARP
  • US12153017B2 patent drawing
  • US12153017B2 patent drawing
  • US12153017B2 patent drawing

AI summary

There is provided a gas analyzer apparatus that analyzes inflowing sample gas. The gas analyzer apparatus includes a filter unit that filters the sample gas, a detector unit that detects the result of filtering, a housing that houses these elements, and a control unit that controls the respective potentials of these elements. The control unit includes a cleaning control unit that sets the respective potentials of the filter unit, the detector unit, and the housing to cleaning potentials that draws in, as plasma for cleaning purposes, process plasma from a source that supplies the sample gas or plasma generated by a plasma generation unit.