Gate Driver Multifunction Pin for Fault Reset and Test Control

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Solution Overview

Problem

Current gate drivers for high-power switching systems are complex and costly due to the need for multiple pins to communicate auxiliary functions such as fault detection, reset, and testing, which increases size and complexity.

Innovation Solution

A multifunction signal pin is used to combine enable, reset, and fault check signals, allowing the gate driver to perform switching, fault sensing, and testing functions, reducing the number of pins required and simplifying communication with a microcontroller.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple pins are used for enable, reset, and fault check signals, then communication functionality is complete, but device complexity and size increase

Engineering Contradiction:
Improvecommunication functionalityVSAvoidnumber of pins
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent applies multi-functionality by enabling a single pin to perform multiple roles: normal operation signal input, fault detection trigger, and test mode activation. The pin accepts different signal patterns (continuous levels vs. transient pulses) to distinguish between normal control signals and test/fault signals, eliminating the need for separate dedicated pins for each function while maintaining complete communication capability

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent merges previously separate functions (enable, reset, fault check) into a single pin interface. By combining these functions and using signal pattern recognition to differentiate between them, the design reduces the pin count while preserving all necessary communication functionalities between the gate driver and microcontroller

Inventive Principle:
Principle #5Merging (Combining)

2Reliability

If multiple pins are used for auxiliary functions, then fault detection capability is complete, but manufacturing cost increases

Engineering Contradiction:
Improvefault detection capabilityVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The same multi-functionality principle reduces manufacturing cost by minimizing the pin count. Fewer pins mean simpler packaging, reduced PCB real estate requirements, and lower overall system cost while the fault detection capability remains intact through the integrated signal handling approach

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

By merging fault detection functionality into the existing multifunction pin rather than requiring a separate dedicated fault pin, the design reduces component count and assembly complexity, directly impacting manufacturing cost reduction while maintaining complete fault detection capability

Inventive Principle:
Principle #5Merging (Combining)

3Reliability

If multiple pins are used for communication, then testing capability is complete, but device size increases

Engineering Contradiction:
Improvetesting capabilityVSAvoiddevice size
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The test mode activation through the multifunction pin demonstrates universality, where the same pin interface handles normal operation, fault detection, and comprehensive testing functions. The gate driver automatically enters test mode when detecting specific pulse patterns, enabling complete testing capability without requiring additional test-specific pins or increasing device footprint

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

By combining testing functionality with the existing multifunction pin rather than adding separate test pins, the design maintains complete testing capability while minimizing device size. The integration of test functions into the primary communication interface eliminates the need for additional physical space that separate test pins would require

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentEP4164129B1Gate driver
Publication Date: 2024.12.18 SEMICON COMPONENTS IND LLC
  • EP4164129B1 patent drawingFigure 1A
  • EP4164129B1 patent drawingFigure 1B
  • EP4164129B1 patent drawingFigure 2A

AI summary

A gate driver to control a high-power switching device is disclosed. The gate driver includes a multifunction pin that allows the gate driver to be controlled by a multifunction signal to perform a number of different functions. For example, a level of the multifunction signal at the multifunction pin can enable/disable the output of the gate driver. In another example, a level of the multifunction signal that is held for a period while the gate driver is in a fault state can reset the state of the gate driver. In another example, pulsing the multifunction signal a number of times can activate a test of the fault detection capabilities of the gate driver. Utilizing one pin for this control, simplifies circuit complexity for communication between a controller and the gate driver, thereby reducing cost and increasing reliability.