Display Panel Gate Driver Aging With Non-Display Heating Pixels
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The existing light emitting display apparatuses face challenges in accurately testing the functionality of gate drivers in the non-display area due to insufficient temperature increase during the aging process, leading to delayed detection of defects.
Innovation Solution
Incorporating non-display light emitting devices connected to non-display transistors in the gate driver area to enhance temperature rise and ensure proper testing of the gate driver functionality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Temperature
If the aging process is carried out by continuously driving light emitting devices in the display area, then the temperature of the display area increases to between 70 and 80 degrees Celsius, but the temperature of the non-display area is only increased to about 55 degrees Celsius and the temperature increasing speed is slower
Solution Approach 1:
The patent divides the light emitting display apparatus into two functional zones: the display area with pixels for normal operation, and the non-display area with dummy pixels specifically for gate driver testing. This segmentation allows independent temperature control and testing functions in different regions, enabling the non-display area to be heated to required temperatures for reliable gate driver defect detection without affecting display performance.
Solution Approach 2:
The dummy pixels in the non-display area serve dual purposes: they act as test subjects for gate driver functionality and simultaneously serve as self-heating elements through continuous light emission. By driving these dummy pixels continuously during aging tests, the system generates sufficient heat in the non-display area to reach 70-80°C, enabling accurate gate driver testing without requiring external heating mechanisms.
2Reliability
If the gate driver is not heated enough during aging process, then the testing can be performed, but it is difficult to accurately test whether the gate driver is defective
Solution Approach 1:
The patent changes the operational parameters of the non-display area by continuously driving dummy pixels at high current, which significantly increases the temperature of the non-display area from the normal 55°C to the required 70-80°C range. This parameter change ensures that the gate driver operates under high-temperature stress conditions, making potential defects detectable and improving testing reliability.
3Temperature
If non-display light emitting devices are added to the non-display area, then the temperature increase speed and maximum temperature are improved, but the device complexity increases
Solution Approach 1:
The dummy pixels in the non-display area are designed to perform multiple functions: they serve as test subjects for gate driver functionality, act as self-heating elements to reach required temperatures, and can be integrated into the existing pixel structure using the same manufacturing processes. This multi-functionality reduces the need for separate heating mechanisms and minimizes additional complexity.
Solution Approach 2:
The patent merges the testing function and heating function into a single integrated system. The dummy pixels are combined with the gate driver circuitry in the non-display area, allowing the same light emitting structures to serve both as test subjects and as heat generation sources. This integration eliminates the need for separate heating elements and reduces overall system complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for rapid and effective temperature increase in the non-display area, enabling accurate testing of gate drivers and ensuring their normal operation.
Implementation Method 1
non-display light emitting devices connected to non-display transistors in the gate driver area to enhance temperature rise
Data Source
AI summary
A light emitting display apparatus in which non-display light emitting devices are provided in a non-display area provided with a gate driver is provided. The light emitting display apparatus includes a light emitting display panel divided into a display area provided with pixels including light emitting devices and a non-display area provided outside the display area and a power supply supplying power to the light emitting display panel, wherein a gate driver for supplying gate pulses to gate lines provided in the light emitting display panel is provided in the non-display area, and a non-display light emitting device is connected to a non-display transistor provided in the gate driver.