Gate Driver Repair Line Bypasses Defective Shift Register Stages
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Solution Overview
Problem
In LCD driving circuits, a defect in one stage of the gate driver prevents all subsequent stages from operating, leading to non-functional pixel cells connected to those gate lines, as the scan pulse propagation is disrupted, resulting in incomplete image display.
Innovation Solution
A gate driver with a repair line and a repair scan pulse generator that provides repair scan pulses based on stored information to bypass malfunctioning stages, ensuring continued operation of the gate driver by connecting the repair line to the first output line and using a storage device to identify and address defective stages.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a stage in the shift register is defective, then the gate driver cannot operate, but adding repair lines and storage devices increases device complexity
Solution Approach 1:
The gate driver is segmented into multiple independent stages (ST101-ST10n+1) in the shift register. Each stage can be independently controlled and repaired. When a defect occurs in one stage, only that specific stage needs to be repaired while other stages continue to function, thus maintaining overall system reliability without requiring complete system replacement.
Solution Approach 2:
A repair line (122) is introduced as an intermediary component that crosses and connects to the first output lines (141a) of the shift register stages. This repair line acts as a mediator to bypass defective stages by providing alternative signal paths. The repair scan pulse generator provides repair scan pulses through this intermediary repair line to restore functionality to affected stages.
2Reliability
If repair lines and storage devices are added to enable defective stage repair, then reliability improves, but manufacturing complexity increases
Solution Approach 1:
Storage devices (271) are pre-installed in each stage of the shift register to store information identifying defective stages before actual defects occur. The repair line infrastructure is also pre-configured to cross and connect with all first output lines. This preliminary preparation enables rapid defect identification and repair without requiring complex real-time diagnostics or reconfiguration during operation.
Solution Approach 2:
The repair mechanism uses a copy of the scan pulse signal path through the repair line (122) that parallels the normal signal flow. The repair scan pulse generator creates a copy of the scanning function that can bypass defective stages. This copying approach allows the repair system to mirror the normal operation without requiring fundamentally different repair mechanisms, simplifying manufacturing.
Data Source
AI summary
A gate driver and a method for repairing the same are disclosed. The gate driver includes a shift register including a plurality of stages each having a respective one of a plurality of first output lines; at least one repair line connectable to the first output lines; a storage device to store information therein to identify a position of a certain stage of the plurality of stages; and a repair scan pulse generator to provide repair scan pulses to the repair line based on information stored in the storage device.