Gate Driving Circuit Pull-Down Holding Module for IGZO Threshold Drift

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The positive bias temperature stress of IGZO-TFTs is unsatisfactory, leading to a positive drift of the voltage threshold, which slows down the speed of turning on IGZO-TFT devices and negatively impacts the GOA circuit.

Innovation Solution

A gate driving circuit with a multi-stage configuration, including a pull-down holding module with specific transistor connections and a dual inverter design, is implemented to maintain stable electric potentials and control signal terminals, ensuring normal switching and output signals.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If IGZO-TFT is used to achieve high carrier mobility and fast response speed, then productivity is improved, but reliability deteriorates due to unsatisfactory positive bias temperature stress performance

Engineering Contradiction:
Improveresponse speedVSAvoidpositive bias temperature stress performance
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent changes the electrical parameters of the IGZO-TFT by introducing specific doping elements (such as gallium) to modify the carrier concentration and mobility characteristics. This allows the device to maintain high productivity while improving stability under positive bias temperature stress conditions.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs composite material structures in the transistor channel layer, combining IGZO with other oxide materials or doping elements to create a composite semiconductor layer. This composite structure leverages the high mobility of IGZO while the additional materials provide improved stability and reduced threshold voltage drift under stress conditions.

Inventive Principle:
Principle #40Composite materials

2Productivity

If multi-stage gate driving units are connected in series to achieve row-by-row scanning, then productivity is improved, but device complexity increases

Engineering Contradiction:
Improverow scan rateVSAvoidcircuit structure
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The gate driving circuit is segmented into multiple independent driving units, each responsible for driving a specific row of pixels. Each unit contains essential components (switching transistors, storage capacitors) that can be replicated, allowing systematic expansion from 1-stage to multi-stage configurations while maintaining manageable complexity through modular design.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements a nested structure where multi-stage gate driving units are systematically integrated, with each stage building upon the previous one. The circuit architecture allows inner stages to be contained within the overall multi-stage structure, enabling scalable expansion where N-stage configurations incorporate the functionality of (N-1) stages while adding one more row scanning capability.

Inventive Principle:
Principle #7Nested doll (Nesting)

Data Source

PatentUS10553169B2Gate driving circuit and liquid crystal display device
Publication Date: 2020.02.04 TCL CHINA STAR OPTOELECTRONICS TECHNOLOGY CO LTD
  • US10553169B2 patent drawing
  • US10553169B2 patent drawing
  • US10553169B2 patent drawing

AI summary

Disclosed are a gate driving circuit and a liquid crystal display device. The gate driving circuit comprises multi-stages of gate driving units. A gate driving unit at each stage includes a pull-down holding module which maintains an electric potential at an output terminal of a gate driving unit at a present stage at a negative electric potential. The influence of a right drift of a threshold voltage of an eighty-second transistor on the gate driving unit can be avoided, and further a speed of pulling down an electric potential at a first node can be increased.