Gate Line Testing Circuit With Switch Unit For Array Substrates

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Solution Overview

Problem

Existing methods for testing gate lines on array substrates in liquid crystal display panels are prone to static electricity damage and additional load effects, leading to abnormal displays and increased complexity and costs due to direct electrical connections.

Innovation Solution

A circuit with a first switch unit, typically a thin film transistor, is used to isolate the gate line from the test pad during normal operation, preventing static electricity and additional load effects, and is activated only when testing is necessary to detect output signals.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the gate line and test pad are directly connected by an electrical lead, then the test pad can test the output waveform of the gate line, but the GOA is susceptible to static electricity during manufacturing and electrostatic damage occurs

Engineering Contradiction:
Improveoutput waveform testing capabilityVSAvoidGOA protection from static electricity
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

A switch unit is introduced as an intermediary component between the gate line and test pad. This switch unit controls the electrical connection state, allowing the gate line to be isolated from the test pad during normal operation, thereby preventing static electricity from reaching the GOA while still enabling testing when the switch is activated.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If the gate line is electrically connected to the test pad, then the test pad can measure the output signal, but the screen is affected by additional loads causing abnormal display

Engineering Contradiction:
Improveoutput signal measurement capabilityVSAvoidadditional load effect on display
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The electrical connection between the gate line and test pad is made dynamic rather than static. The switch unit can change the connection state between connected and isolated, allowing the system to adapt between testing mode (connected) and normal display mode (isolated), thus eliminating the harmful additional load effect during display while maintaining measurement capability during testing.

Inventive Principle:
Principle #15Dynamics

3Reliability

If a switch unit is introduced to isolate the gate line from the test pad, then static electricity protection is improved, but the device complexity increases

Engineering Contradiction:
ImproveGOA protection from static electricityVSAvoidcircuit structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The switch unit utilizes changes in electrical parameters (conductivity state) to achieve isolation. By controlling the switch unit's on/off state through voltage or control signals, the system can transition between connected and isolated states without requiring complex mechanical structures, thus protecting against static electricity while maintaining relatively simple device architecture.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Ensures electrical isolation between the gate line and test pad, preventing static electricity damage and abnormal displays, while allowing for effective testing of gate lines to identify and prevent recurring issues, thus improving display quality and reducing production costs.

Implementation Method 1

the gate line is always electrically isolated from the test pad when the first switch unit is deactivated

Methodology Applied
Scientific EffectElectrical insulation: Conduction (electrical)

Data Source

PatentUS10672675B2Circuit and method for testing gate lines of array substrate
Publication Date: 2020.06.02 WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
  • US10672675B2 patent drawing
  • US10672675B2 patent drawing
  • US10672675B2 patent drawing

AI summary

Related to is a gate on array. A circuit for testing a gate line of an array substrate includes: a test pad and a first switch unit which connects the test pad and the gate line and has an end connected to a control terminal. A voltage is applied to the control terminal to control activation and deactivation of the first switch unit. The gate line is in normal operation when the first switch unit is deactivated, and the test pad tests a signal of the gate line when the first switch unit is activated. In normal display, the first switch unit is deactivated, and the gate line is in normal operation. This can avoid influences of an additional load, which would otherwise cause abnormal display of a picture. In a manufacturing procedure, explosive wound caused by electrostatic discharge of the test pad can be prevented. When a display device cannot be lit, an external voltage can be introduced to activate the first switch unit, so as to detect a signal of the gate line.