Semiconductor Gate and Word Line Leveling for Flat Top Surfaces

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Solution Overview

Problem

The scaling down of semiconductor devices poses challenges in achieving improved quality, yield, performance, and reliability due to issues such as complexity and surface flatness, which affects subsequent processing and carrier mobility.

Innovation Solution

A semiconductor device design with a gate structure and word lines having top surfaces at the same vertical level, facilitated by a method involving the formation of insulating layers, conductive films, and doped regions, along with stress regions to enhance carrier mobility and surface flatness.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If semiconductor devices are scaled down to improve computing ability, then device density and integration are improved, but manufacturing precision and surface flatness deteriorate

Engineering Contradiction:
Improvedevice densityVSAvoidsurface flatness
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent transitions from planar 2D structures to three-dimensional structures with multiple vertical levels. Word lines and gate structures are positioned at different heights, creating a stacked architecture that increases device density while maintaining controllable surface flatness at each level through separate planarization processes.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The device is divided into multiple independent structural units with word lines and gate structures separated into different vertical levels. This segmentation allows independent fabrication and planarization of each level, improving manufacturing precision while enabling higher integration density.

Inventive Principle:
Principle #1Segmentation

2Reliability

If complex multi-layer structures are formed to improve device performance, then functionality is improved, but device complexity increases

Engineering Contradiction:
Improvedevice performanceVSAvoidstructural complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Multiple functional elements (word lines, gate structures, insulating layers) are merged into a unified three-dimensional stacked architecture. The gate structure and word lines are integrated at different vertical levels, reducing the number of separate fabrication processes while maintaining enhanced device performance.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The multi-layer structure serves multiple functions simultaneously: the first insulating layer provides electrical isolation, the gate structure provides control functionality, and the word lines provide signal transmission. Each structural element contributes to multiple device functions, reducing overall complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS11830919B2Semiconductor device and method for fabricating the same
Publication Date: 2023.11.28 NAN YA TECH
  • US11830919B2 patent drawing
  • US11830919B2 patent drawing
  • US11830919B2 patent drawing

AI summary

The present application discloses a method for fabricating a semiconductor device with a flat surface. The method for fabricating a semiconductor device including providing a substrate, forming a gate structure on the substrate, and forming a plurality of word lines having top surfaces at a same vertical level as a top surface of the gate structure.