Gemstone Composition Analysis Using Oblique Luminescence Tomography
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Solution Overview
Problem
Existing methods struggle to effectively identify doublet gemstones, particularly type IIa/IaAB diamonds, which may pass initial screening and remain undetected by advanced instruments, posing a challenge in the gemstone industry.
Innovation Solution
A method utilizing Scheimpflug tomography to analyze luminescence emitted from gemstones by passing an excitation beam through the gemstone and capturing it at an oblique angle, generating an axial profile to detect discontinuities indicative of doublets, using wavelengths suitable for both mounted and loose stones.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If deep UV imaging instruments are used to identify synthetic diamonds, then identification of pure synthetics is improved, but identification of doublet gemstones remains ineffective
Solution Approach 1:
The detection method segments the gemstone analysis into multiple luminescence measurements taken at different positions along the vertical axis. By dividing the gemstone into multiple measurement zones and comparing their luminescence profiles, the system can identify discontinuities that indicate doublet structures, thereby extending detection capability beyond what single-point measurements provide.
Solution Approach 2:
The invention transitions from two-dimensional surface imaging to three-dimensional volumetric analysis by measuring luminescence at multiple vertical positions through the gemstone. This dimensional extension allows detection of internal structures and layering that cannot be detected by surface-only methods, enabling identification of doublet gemstones.
2Reliability
If advanced screening instruments are used, then detection capability is improved, but doublet gemstones may still pass undetected
Solution Approach 1:
The system implements feedback by comparing luminescence measurements from different vertical positions within the gemstone. When discontinuities or mismatches are detected between upper and lower portions, the system identifies these as indicators of doublet structure, providing a self-verifying detection mechanism that improves reliability.
Solution Approach 2:
The invention changes the measurement parameter from surface reflectivity to internal luminescence transmission. By measuring how light passes through and is emitted from different depths of the gemstone, the method reveals internal structural information that makes doublet detection more reliable and less challenging.
3Measurement precision
If luminescence is captured from multiple angles, then detection accuracy is improved, but device complexity increases
Solution Approach 1:
Instead of moving the detector around the gemstone to capture luminescence from multiple angles, the invention inverts the approach by keeping the detector stationary and moving the excitation source through the gemstone from the top. This simplifies the mechanical system while still achieving comprehensive luminescence mapping through the vertical dimension.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate identification of doublet gemstones by revealing material discontinuities within the gemstone, allowing differentiation between natural and synthetic layers, even when the gemstone is mounted in jewelry.
Implementation Method 1
The emitted luminescence may be fluorescence
Implementation Method 2
Additionally or alternatively, the emitted luminescence may be phosphorescence
Data Source
AI summary
A method of determining the composition of a polished gemstone includes passing an excitation beam through the gemstone from a table facet substantially to a culet of the gemstone, an axis of the excitation beam being substantially perpendicular to the table facet; and capturing luminescence emitted by the gemstone from an angle oblique to the axis of the excitation beam.