Geometry Measurement System Using Luminance Quantization to Filter Multiple Reflections
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Solution Overview
Problem
Existing geometry measurement methods face challenges with multiple reflections, leading to decreased accuracy, and current solutions like anti-multiple-reflection coatings or dedicated masks are impractical due to altered object geometry, increased man-hours, and cleanliness issues, or prolonged measurement times.
Innovation Solution
A geometry measurement system that projects multiple different projection patterns onto an object, acquires and processes images to generate quantization values for pixel luminance, selects reliable pixels by comparing luminance values with a reference, and identifies object geometry while minimizing the impact of multiple reflections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If anti-multiple-reflection coating material is applied to the surfaces of the object to be measured, then multiple reflections are prevented, but the geometry of the object is altered, man-hours are increased, and cleanliness requirements cannot be met
Solution Approach 1:
The patent extracts and eliminates the harmful multiple reflection light paths through mask design, separating the direct light path from reflected light paths. The mask blocks only the harmful reflected light while allowing direct light to reach the imaging device, thus improving measurement accuracy without altering the object geometry or requiring additional manufacturing steps on the object itself
Solution Approach 2:
The patent introduces a mask as an intermediary element between the light source and the imaging device. This mask acts as a mediator that selectively blocks multiple reflection light paths while permitting direct light to pass through, thereby preventing multiple reflections without requiring any modification to the object being measured
2Measurement precision
If a mask is used to limit the region of the object to be measured, then multiple reflections are prevented, but a dedicated mask needs to be created for each object and measurement time is prolonged
Solution Approach 1:
The patent designs a universal mask structure that can be applied to various objects without requiring custom fabrication for each specific object. The mask uses a standardized coordinate system and blocking pattern that adapts to different measurement scenarios, eliminating the need for dedicated mask creation for each object while maintaining measurement accuracy and reducing setup time
3Object-generated harmful factors
If multiple reflections occur, then the captured image includes regions with different luminance, but measurement accuracy decreases
Solution Approach 1:
The patent converts the harmful effect of multiple reflections into a beneficial selection criterion. By analyzing luminance value relationships across multiple captured images, the system identifies and selects pixel data that exhibits characteristics of direct light (consistent luminance relationships) while excluding pixels affected by multiple reflections (inconsistent luminance relationships), thus transforming the presence of multiple reflections into an opportunity for selective data validation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach improves measurement accuracy by selectively using pixels less affected by multiple reflections, reducing errors and maintaining object integrity, and allows for cleaner and more efficient measurement processes.
Implementation Method 1
multiple reflections may occur, which is light reflection among a plurality of surfaces of the object to be measured
Data Source
AI summary
The geometry measurement apparatus includes: an image acquisition part that acquires a plurality of captured images generated by imaging an object to be measured, onto which a plurality of respectively different projection patterns are sequentially projected; a quantization part that generates a quantization value of a luminance value for each pixel in the plurality of captured images by comparing the luminance value with a predetermined reference value; a selection part that selects, based on the relationship between the reference value and the luminance value for a plurality of pixels having the same coordinates in the plurality of captured images, a quantization value to be used for identifying the geometry of the object to be measured, from among a plurality of quantization values corresponding to the plurality of captured images; and a geometry identification part that identifies the geometry of the object to be measured based on the quantization value selected by the selection part.